Hot spot localization in the field of view of the Kirkpatrick–Baez microscope
Source abstract
Abstract
The Kirkpatrick–Baez (KB) microscope is an effective instrument for x-ray imaging of hot spot. However, the non-uniform distribution of response efficiency in the field of view is a drawback of the KB microscope. A more accurate hot spot image requires the correction of the measured image by combining the hot spot position and the response efficiency distribution. Here, we describe a method to locate the position of the hot spot in the field of view during hot spot imaging with a KB microscope. The position of the hot spot in the field of view can be obtained by measuring the grazing incidence angle change during hot spot imaging. In the experiment of hot spot self-emission imaging with a four-channel KB microscope, the location of the hot spot with an accuracy of 15 μm was realized, and the intensity corrected hot spot image was obtained. This will solve the problem of the non-uniform distribution of the response efficiency of the KB microscope and enable quantitative measurement of hot spot radiation intensity.
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Research context
OpenAlex topics: Advanced X-ray Imaging Techniques · Advanced X-ray and CT Imaging · X-ray Spectroscopy and Fluorescence Analysis
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
Affiliations
National Key Laboratory of Plasma Physics, Laser Fusion Research Center, China Academy of Engineering Physics 1 , Mianyang 621900, China
Department of Engineering Physics, Tsinghua University 2 , Beijing 100084, China
Key Laboratory of Advanced Micro-structured Materials, Ministry of Education, Tongji University 3 , Shanghai 200092, China
School of Physics Science and Engineering, Tongji University 4 , Shanghai 200092, China
Funding
National Key Research and Development Program of China · National Natural Science Foundation of China
References (25)
Show source-provided references
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