journal article·2021-01-01Open access

Experimental study of destructive effects on materials with different energy electron bombardment

Nongchao Tan, Ping Wu, Ye Hua, Jun Sun, Wenhui Huang, Wenhua Huang

AIP Advances· Volume 11· Issue 1

Abstract

In the study of breakdown in high power microwave (HPM) devices, researchers pay attention to the plasma effects caused by material ablation under electron bombardment. In this paper, the destruction of material under the bombardment of electrons with a range of energies around 100 keV is investigated. The simulation results reveal that low-energy electrons are more likely to cause ablation damage to the material, with the location of maximal energy deposition density close to the material’s surface. The experiment has a good agreement with the simulation results. Compared with high-energy electrons, the damage traces bombarded by low-energy electrons are more serious, possessing the characteristics of large size and shallow depth. This abnormal physics phenomenon provides a reference for the breakdown of HPM devices and the surface treatment of materials by pulsed electron beams.
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Research context

OpenAlex topics: Gyrotron and Vacuum Electronics Research · Pulsed Power Technology Applications · Particle accelerators and beam dynamics

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

Affiliations

Key Laboratory of Particle and Radiation Imaging (Tsinghua University), Ministry of Education 1 , Beijing 100084, China

Department of Engineering Physics, Tsinghua University 2 , Beijing 100084, China

Science and Technology on High Power Microwave Laboratory, Northwest Institute of Nuclear Technology 3 , Xi’an, Shaanxi 710024, China

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