Field-free switching model of spin–orbit torque (SOT)-MTJ device with thermal effect based on voltage-controlled magnetic anisotropy (VCMA)

Electrically driven magnetization switch has attracted much attention in the new spintronic memory, especially for spin–orbit torque (SOT)-based magnetic random access memory (MRAM). However, the published models are facing limitations with the continuous shrinkage of the feature size down to nanoscale. Also, the thermal effect caused by switching operation is non-negligible. Therefore, an effective model is needed to represent the switching dynamic of the device concerning the influences of the nanoscale and the thermal effect. In the paper, a compact model of three-terminal SOT-driven switching is established. The influence of the voltage-controlled magnetic anisotropy (VCMA) and spin transfer torque (STT) effect induced by bias voltage on the field-free SOT-driven switching is considered by numerically solving the LLG equations. Furthermore, a 3D model of the SOT-MTJ device is established by finite element method to trace the thermoelectric behavior inside the device. The thermoelectric behavior is integrated into the compact model to show the influence of the temperature on the switching behavior, highlighting the importance of the thermal effect for the realistic modelling of SOT-driven switching. Finally, a novel voltage pulse scheme is proposed, which can effectively shorten the switching time and improve the reliability of the device. The established model could provide strategies and guidelines for next-generation memory design and application.