A high-Q mid-infrared Tamm plasmon absorber using MgF2 and Ge aperiodic tandem films designed by the genetic algorithm
Source abstract
Abstract
A high-Q mid-infrared Tamm plasmon (TP) absorber using MgF2 and Ge aperiodic tandem films is designed by the genetic algorithm and fabricated by electron beam evaporation and magnetron sputtering. Such a design circumvents the need for the distributed Bragg reflector grating, and the thickness of individual MgF2 films is much smaller than a quarter of wavelength in films (λ/4n). The fabricated TP absorber exhibits a high and sharp absorption peak at 2.73 μm with a quality factor (Q) of 144, while the simulated counterpart has the absorption peak at 2.72 μm with a Q of 155. The profiles of an electromagnetic field in the tandem films are also simulated to reveal the mechanism of narrow thermal emission. Such a high-Q TP absorber is very promising in the mid-infrared simulator and detection.
Source: crossref · Quality: baseline
Research context
OpenAlex topics: Thermal Radiation and Cooling Technologies · Metamaterials and Metasurfaces Applications · Plasmonic and Surface Plasmon Research
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
Affiliations
Beijing National Research Center for Information Science and Technology, Department of Electronic Engineering, Tsinghua University 1 , Beijing 100084, China
Flexible Intelligent Optoelectronic Device and Technology Center, Institute of Flexible Electronics Technology of Tsinghua University 2 , Jiaxing, Zhejiang 314006, China
Center for Flexible Electronics Technology, Tsinghua University 3 , Beijing 100084, China
Funding
National Key Research and Development Program of China · National Natural Science Foundation of China · Key Lab Program of BNRist · China Postdoctoral Science Foundation · Collaborative Innovation Centre of Solid-State Lightling and Energy-Saving Electronics
References (29)
Show source-provided references
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