FEM thermal and stress analysis of bonded GaN-on-diamond substrate
Abstract
Research context
OpenAlex topics: GaN-based semiconductor devices and materials · Thermal properties of materials · Silicon Carbide Semiconductor Technologies
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Affiliations
Key Laboratory for Physical Electronics and Devices of the Ministry of Education and Key Laboratory of Photonics Technology for Information of Shaanxi Province, School of Electronics and Information Engineering, Xi’an Jiaotong University 1 , Xi’an 710049, P.R. China
Wide Band Gap Semiconductor Research Center, Xi’an Jiaotong University 2 , Xi’an 710049, PR China
ISCAS-XJTU Joint Laboratory of Functional Materials and Devices for Informatics, School of Electronics and Information Engineering, Xi’an Jiaotong University 3 , Xi’an 710049, P.R. China
Funding
National Natural Science Foundation of China