Image contrast reversals in contact resonance atomic force microscopy
Source abstract
Abstract
Multiple image contrast inversions are observed along with the increase of modulation frequency for contact resonance atomic force microscopy (CR-AFM) imaging of a highly oriented pyrolytic graphite (HOPG) specimen. Analysis of the contact vibrational spectra indicates that the inversions can be attributed to structure-induced variations of tip-sample contact mechanics. Contact stiffness and damping at HOPG step edges exhibit significant increases relative to those in the flat regions. For quantitative evaluation of mechanical properties in CR-AFM, coupling effects of the surface geometry must be considered.
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Research context
OpenAlex topics: Force Microscopy Techniques and Applications · Integrated Circuits and Semiconductor Failure Analysis · Near-Field Optical Microscopy
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Affiliations
University of Science and Technology of China Department of Precision Machinery and Precision Instrumentation, , Hefei, Anhui 230026, China
Funding
973 Project · National Natural Science Foundation of China
References (27)
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