journal article·2020-04-01Open access

Core loss calculation for power electronics converter excitation from a sinusoidal excited core loss data

Hiroaki Matsumori, Toshihisa Shimizu, Takashi Kosaka, Nobuyuki Matsui

AIP Advances· Volume 10· Issue 4

Abstract

The authors propose a core loss calculation method for power electronics converter excitation from sinusoidal excited core loss data. This method is based on Brockmeyer’s theory and adapts to calculate core loss under DC-bias excitation conditions. Furthermore, the number of core loss test conditions are reduced as this method only requires the addition of DC-bias characteristics to the sinusoidal excitation core loss data provided by the core manufacturers. To validate the proposed method, the core losses under sinusoidal and square voltage excitations are first measured by a BH analyzer with a DC-bias excitation unit. Then, the measured values under a square voltage excitation and the calculated values from a sinusoidal excited core loss data are compared.
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Research context

OpenAlex topics: Magnetic Properties and Applications · Silicon Carbide Semiconductor Technologies · HVDC Systems and Fault Protection

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

Affiliations

Nagoya Institute of Technology/ Electrical and Mechanical Eng. 1 , Aichi 466-8555, Japan

Tokyo Metropolitan University/System Design Eng. 2 , Tokyo 192-0397, Japan

Funding

The Nitto Foundation

References (13)

Show source-provided references
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