journal article·2018-10-01Open access

Development of a high-energy-resolution EDXRD system with a CdTe detector for security inspection

Yifan Chen, Xin Wang, Qinghua Song, Jie Xu, Baozhong Mu

AIP Advances· Volume 8· Issue 10

Abstract

Energy dispersive X-ray diffraction (EDXRD) has great potential for application in the field of security inspection. On the basis of the Bragg’s diffraction law, an EDXRD system simulation model was established. Using this model, the effect of geometrical parameters on the energy resolution and collecting efficiency was calculated. Based on the analysis data, an optimized EDXRD system with high energy resolution and sensitivity was constructed. The experimental results demonstrated that the system’s energy resolution was approximately 5% with an integration time of 3 s. For concealed samples, more sampling time was needed because of the stronger signal attenuation; however, an effective spectrum could still be obtained in less than 10 s. The system can be used to identify hidden contraband accurately, especially in specific regions of interest detected by imaging technology.
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Research context

OpenAlex topics: Advanced X-ray and CT Imaging · Radiation Shielding Materials Analysis · Advanced X-ray Imaging Techniques

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

Affiliations

MOE Key Laboratory of Advanced Micro-Structured Materials 1 , No. 1239 Siping Road, Shanghai 200092, China

Tongji University, School of Physics Science and Engineering 2 , No. 1239 Siping Road, Shanghai 200092, China

Funding

National Key Research and Development Plan

References (13)

Show source-provided references
1. Crime Sci. · 2013 · 2 · 410.1186/2193-7680-2-4 ↗
2. J. Instrum. · 2013 · 8 · P0300710.1088/1748-0221/8/03/p03007 ↗
3. Appl. Radiat. Isot. · 2007 · 65 · 95910.1016/j.apradiso.2007.02.010 ↗
4. Nucl. Instrum. Methods Phys. Res., Sect. A · 2011 · 654 · 45010.1016/j.nima.2011.06.043 ↗
5. Appl. Radiat. Isot. · 2009 · 67 · 28710.1016/j.apradiso.2008.08.006 ↗
6. Appl. Radiat. Isot. · 2012 · 70 · 122810.1016/j.apradiso.2011.12.015 ↗
7. Proc. SPIE · 2009 · 7306 · 73061910.1117/12.820887 ↗
8. Crime Sci. · 2017 · 6 · 110.1186/s40163-016-0062-9 ↗
9. 2010 · 3873
10. Opt. Express · 2015 · 23 · 1344310.1364/oe.23.013443 ↗
11. Nucl. Instrum. Methods Phys. Res., Sect. A · 2012 · 664 · 32410.1016/j.nima.2011.10.045 ↗
12. IEEE Trans. Nucl. Sci. · 2009 · 56 · 123810.1109/tns.2008.2010124 ↗
13. 1980