journal article·2018-09-01Open access

High performance top gate a-IGZO TFT utilizing siloxane hybrid material as a gate insulator

Chaiyanan Kulchaisit, Juan Paolo Soria Bermundo, Mami N. Fujii, Yasuaki Ishikawa, Yukiharu Uraoka

AIP Advances· Volume 8· Issue 9

Abstract

We demonstrated gate insulators (GI) fabricated by solution process with the aim of replacing traditional vacuum processed GI. We selected solution siloxane-based material due to its extremely high thermal resistance, excellent transparency, flexibility, and simple cost-effective fabrication. We made top gate TFT by depositing a siloxane gate insulator through spin-coating technique on a-IGZO. For comparison, we measured a conventional a-IGZO TFT using SiO2 as a GI for a reference. The TFTs with siloxane GI showed extremely high mobility (µ= 22±3 cm2·V-1·s-1), ultra-smooth interface (no hysteresis), and including other suitable electrical characteristics that are promising to enable the possibility to fabricate high performance all-solution processed devices in the future.
Source: crossref · Quality: baseline

Research context

OpenAlex topics: Thin-Film Transistor Technologies · Semiconductor materials and devices · Silicon and Solar Cell Technologies

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

Affiliations

Nara Institute of Science and Technology , Ikoma, Nara 630-0192, Japan

References (45)

Show source-provided references
1. Sci. Technol. Adv. Mater. · 2010 · 11 · 04430510.1088/1468-6996/11/4/044305 ↗
2. Appl. Phys. Rev. · 2016 · 3 · 02130310.1063/1.4953034 ↗
3. Nature · 2004 · 432
4. J. Appl. Phys. · 2006 · 99 · 11110110.1063/1.2199753 ↗
5. Jpn. J. Appl. Phys. · 2006 · 45 · 430310.1143/jjap.45.4303 ↗
6. J. Appl. Phys. · 1993 · 74 · 263810.1063/1.354655 ↗
7. Appl. Phys. Lett. · 2010 · 97 · 10210210.1063/1.3479925 ↗
8. Appl. Phys. Lett. · 2011 · 99 · 05350510.1063/1.3622121 ↗
9. Appl. Phys. Lett. · 1998 · 72 · 283510.1063/1.121473 ↗
10. Phys. Rev. Lett. · 1998 · 81 · 301410.1103/physrevlett.81.3014 ↗
11. Appl. Phys. Lett. · 1997 · 71 · 380210.1063/1.120510 ↗
12. Thin Solid Films · 2010 · 518 · 303010.1016/j.tsf.2009.09.165 ↗
13. Microelectron. J. · 2007 · 38 · 78310.1016/j.mejo.2007.04.012 ↗
14. AIP Adv. · 2013 · 3 · 03213710.1063/1.4798305 ↗
15. Appl. Nanosci. · 2012 · 2 · 110.1007/s13204-011-0033-0 ↗
16. J. Vac. Sci. Tech. A. · 2006 · 24 · 29110.1116/1.2171706 ↗
17. J. Appl. Phys. · 2010 · 107 · 06431410.1063/1.3327430 ↗
18. Micro. Eng. · 2010 · 87 · 63510.1016/j.mee.2009.08.029 ↗
19. Appl. Mater. Interfaces · 2016 · 8 · 206110.1021/acsami.5b10520 ↗
20. Sci. Rep. · 2015 · 5 · 1816810.1038/srep18168 ↗
21. Sci. Rep. · 2016 · 6 · 3357610.1038/srep33576 ↗
22. Phys. Stat. Solidi A. · 2010 · 207 · 166810.1002/pssa.200983724 ↗
23. Mat. Res. Soc. Symp. Proc. · 2000 · 558 · 40310.1557/proc-558-403 ↗
25. J. Appl. Phys. · 2002 · 92 · 525910.1063/1.1511826 ↗
27. Appl. Phys. Lett. · 2015 · 107 · 03350410.1063/1.4927274 ↗
28. Appl. Phys. Lett. · 2015 · 107 · 10330210.1063/1.4930305 ↗
29. Thin Solid Film · 2007 · 516 · 37410.1016/j.tsf.2007.08.014 ↗
30. 2003
31. J. Disp. Technol. · 2016 · 12
32. Appl. Phys. Lett. · 2008 · 93 · 05350110.1063/1.2966145 ↗
33. IEEE Elec. Dev. Lett. · 2011 · 32
34. Chem. Mater. · 2004 · 16 · 454310.1021/cm049598q ↗
35. Appl. Mater. Interfaces · 2017 · 9 · 52910.1021/acsami.6b11214 ↗
36. Appl. Mater. Interfaces · 2015 · 7 · 1401110.1021/acsami.5b03105 ↗
37. IEEE Electron Device Lett. · 2011 · 32
38. Appl. Nanosci. · 2016 · 6 · 21510.1007/s13204-015-0432-8 ↗
39. IEEE Electron Device Lett. · 1996 · 17 · 17810.1109/55.485166 ↗
40. IEEE Trans. Electron Devices. · 2009 · 56 · 29110.1109/ted.2008.2010591 ↗
41. Appl. Phys. Lett. · 2013 · 103 · 20211410.1063/1.4832076 ↗
42. ECS J. Solid State Sci. Technol. · 2014 · 3 · Q1610.1149/2.011402jss ↗
43. AIP Adv. · 2015 · 5 · 01711610.1063/1.4905903 ↗
44. J. Display Technol. · 2009 · 5 · 27310.1109/jdt.2009.2021582 ↗
45. J. Appl. Phys. · 2014 · 115 · 21450110.1063/1.4880163 ↗