journal article·2016-04-01Open access

Enhanced flashover strength in polyethylene nanodielectrics by secondary electron emission modification

Weiwang Wang, Shengtao Li, Daomin Min

AIP Advances· Volume 6· Issue 4

Abstract

This work studies the correlation between secondary electron emission (SEE) characteristics and impulse surface flashover in polyethylene nanodielectrics both theoretically and experimentally, and illustrates the enhancement of flashover voltage in low-density polyethylene (LDPE) through incorporating Al2O3 nanoparticles. SEE characteristics play key roles in surface charging and gas desorption during surface flashover. This work demonstrates that the presence of Al2O3 nanoparticles decreases the SEE coefficient of LDPE and enhances the impact energy at the equilibrium state of surface charging. These changes can be explained by the increase of surface roughness and of surface ionization energy, and the strong interaction between nanoparticles and the polymer dielectric matrix. The surface charge and flashover voltage are calculated according to the secondary electron emission avalanche (SEEA) model, which reveals that the positive surface charges are reduced near the cathode triple point, while the presence of more nanoparticles in high loading samples enhances the gas desorption. Consequently, the surface flashover performance of LDPE/Al2O3 nanodielectrics is improved.
Source: crossref · Quality: baseline

Research context

OpenAlex topics: High voltage insulation and dielectric phenomena · Electrostatic Discharge in Electronics · Dielectric materials and actuators

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

Affiliations

Xi’an Jiaotong University State Key Laboratory of Electrical Insulation and Power equipment, School of Electrical Engineering, , Xi’an, Shaanxi, 710049, China

Funding

National Basic Research Program of China · National Natural Science Foundation of China

References (44)

Show source-provided references
1. J. Appl. Phys. · 1991 · 69 · 633410.1063/1.348832 ↗
2. Vacuum · 1968 · 18 · 38310.1016/0042-207X(68)90628-3 ↗
3. App.l Phys. Lett. · 1974 · 24 · 5410.1063/1.1655091 ↗
4. J. Appl. Phys. · 1977 · 48 · 421010.1063/1.323405 ↗
5. J. Appl. Phys. · 1977 · 48 · 307310.1063/1.324077 ↗
6. J. Appl. Phys. · 1980 · 51 · 141410.1063/1.327839 ↗
7. Vacuum · 1977 · 27 · 64310.1016/S0042-207X(77)80484-3 ↗
8. J. Appl. Phys. · 1982 · 53 · 298310.1063/1.331037 ↗
9. J. Appl. Phys. · 1985 · 58 · 334610.1063/1.335796 ↗
10. IEEE Trans. Electr. Insul. · 1993 · 28 · 43710.1109/14.231522 ↗
11. IEEE Trans. Electr. Insul. · 1993 · 28 · 51210.1109/14.231534 ↗
12. J. Appl. Phys. · 1967 · 38 · 201910.1063/1.1709821 ↗
13. J. Appl. Phys. · 1984 · 56 · 137410.1063/1.334128 ↗
14. IEEE Trans. Plasma Sci. · 2010 · 38 · 343410.1109/TPS.2010.2080288 ↗
15. IEEE Trans. Plasma Sci. · 2010 · 38 · 165610.1109/TPS.2010.2049127 ↗
16. IEEE Trans. Electr. Insul. · 1989 · 24 · 98510.1109/14.46324 ↗
17. IEEE Trans. Electr. Insul. · 1989 · 24 · 99110.1109/14.46325 ↗
18. 1997 · 537
19. J. Appl. Phys. · 1990 · 67 · 699110.1063/1.345044 ↗
20. IEEE Trans. Dielectr. Electr. Insul. · 2003 · 10 · 55010.1109/TDEI.2003.1219636 ↗
21. J. Appl. Phys. · 1992 · 71 · 38910.1063/1.350720 ↗
22. Nanotechnology · 2004 · 15 · 58610.1088/0957-4484/15/5/032 ↗
23. IEEE Trans. Dielectr. Electr. Insul. · 2004 · 11 · 79710.1109/TDEI.2004.1349785 ↗
24. IEEE Trans. Dielectr. Electr. Insul. · 2008 · 15 · 3310.1109/T-DEI.2008.4446734 ↗
25. IEEE Trans. Dielectr. Electr. Insul. · 2010 · 17 · 152310.1109/TDEI.2010.5595554 ↗
26. App.l Phys. Lett. · 2009 · 95
27. IEEE Trans. Dielectr. Electr. Insul. · 2010 · 17 · 60710.1109/TDEI.2010.5448118 ↗
29. IEEE Trans. Dielectr. Electr. Insul. · 2007 · 14 · 79010.1109/TDEI.2007.4286508 ↗
30. 2008 · 36
31. 2011 · 486
32. IEEE Trans. Dielectr. Electr. Insul. · 2004 · 11 · 73910.1109/TDEI.2004.1349779 ↗
33. IEEE Trans. Dielectr. Electr. Insul. · 2014 · 21 · 51910.1109/TDEI.2013.004131 ↗
34. J. Appl. Phys. · 1985 · 58 · 13210.1063/1.335698 ↗
35. J. Appl. Phys. · 1985 · 58 · 14610.1063/1.335700 ↗
37. IEEE Trans. Electr. Insul. · 1973 · EI-8 · 1710.1109/TEI.1973.299238 ↗
38. Appl. Phys. A · 1982 · 28 · 110.1007/BF00617778 ↗
39. Adv. Electron El Phys. · 1959 · 11 · 41310.1016/S0065-2539(08)60999-3 ↗
40. J. SPACECRAFT AND ROCKETS · 1993 · 30 · 18910.2514/3.11527 ↗
41. J. Phys. D: Appl. Phys. · 2005 · 38 · 243310.1088/0022-3727/38/14/020 ↗
42. J. Appl. Phys. · 1983 · 54 · R110.1063/1.332840 ↗
43. Phys. Rev. Lett. · 1998 · 80 · 19310.1103/PhysRevLett.80.193 ↗
44. IEEE Trans. Electr. Insul. · 1993 · 28 · 70610.1109/14.231554 ↗