Electronegativity-dependent tin etching from thin films
Source abstract
Abstract
The influence of a thin film substrate material on the etching of a thin layer of deposited tin (Sn) by hydrogen radicals was studied. The amount of remaining Sn was quantified for materials that cover a range of electronegativities. We show that, for metals, etching depends on the relative electronegativity of the surface material and Sn. Tin is chemically etched from surfaces with an electronegativity smaller than Sn, while incomplete Sn etching is observed for materials with an electronegativity larger than Sn. Furthermore, the amount of remaining Sn increases as the electronegativity of the surface material increases. We speculate, that, due to Fermi level differences in the material’s electronic structure, the energy of the two conduction bands shift such that the availability of electrons for binding with hydrogen is significantly reduced.
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Research context
OpenAlex topics: Advanced Chemical Physics Studies · Gas Sensing Nanomaterials and Sensors · Catalytic Processes in Materials Science
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
Affiliations
University of Twente Industrial Focus Group XUV Optics, MESA+ Institute for Nanotechnology, , Drienerlolaan 5, Enschede, the Netherlands
Funding
Focus Group IFG-XUV · Nanonext 9B NNXT 9B04 · SP3E 123
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Show source-provided references
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