journal article·2020-03-01Open access

Review of developments on polymers’ breakdown characteristics and mechanisms on a nanosecond time scale

Liang Zhao, Jian Cang Su, Chun Liang Liu

AIP Advances· Volume 10· Issue 3

Abstract

The breakdown of polymer insulators at a nanosecond scale is a serious problem for high-voltage devices and pulsed power systems. This paper reviews recent developments in research on the mechanisms and characteristics of the breakdown of polymers at a nanosecond scale at the Northwest Institute of Nuclear Technology. An improved avalanche breakdown model is proposed, and a formula for the strength of the electric breakdown (EBD) is formulated based on it. The formative time lag of the avalanche breakdown model is then developed to verify it. Two research groups were formed to study the characteristics of the breakdown. One focused on the characteristics of single-pulse breakdown, such as the effects of size, polymer type, electrode, pulse width, and pulse polarity on EBD, with the aim of deriving expressions for EBD. The other research group examined cumulative (multi-pulse) characteristics of the breakdown with the aim of deriving a formula for the lifetime of the polymer. A method to design solid insulation structures is finally proposed.
Source: crossref · Quality: baseline

Research context

OpenAlex topics: High voltage insulation and dielectric phenomena · Electrostatic Discharge in Electronics · Lightning and Electromagnetic Phenomena

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

References (97)

Show source-provided references
1. 2006
2. 2005
4. 2008
5. Phys. Plasmas · 2011 · 18 · 05570210.1063/1.3560599 ↗
6. Proc. IEEE · 2004 · 92 · 116610.1109/jproc.2004.829005 ↗
7. 1991 · 73
8. 1995
9. 2001 · 1249
10. Proc. IEEE · 2004 · 92 · 108210.1109/jproc.2004.829020 ↗
11. 2007
12. Laser Part. Beams · 2003 · 21 · 19710.1017/s0263034603212076 ↗
13. 1998
14. High Power Laser Part. Beams · 2011 · 23 · 291910.3788/hplpb20112311.2919 ↗
15. High Power Laser Part. Beams · 2010 · 22 · 71210.3788/hplpb20102204.0712 ↗
16. Deng · 2008 · 294
17. Laser Part. Beams · 2011 · 29 · 5510.1017/s0263034610000753 ↗
18. Cooperstein · 1997 · 537
19. 1999 · 1403
20. IEEE Trans. Plasma Sci. · 2010 · 38 · 136910.1109/tps.2010.2040489 ↗
21. High Power Laser Part. Beams · 2009 · 21 · 61710.1002/9780470611807.ch2 ↗
22. Rev. Sci. Instrum. · 2014 · 85 · 06330310.1063/1.4884341 ↗
23. IEEE Trans. Plasma Sci. · 2009 · 37 · 195410.1109/TPS.2009.2025278 ↗
24. High Power Laser Part. Beams · 2010 · 22 · 49410.3788/hplpb20102203.0494 ↗
25. IEEE Electr. Insul. Mag. · 2013 · 29 · 810.1109/mei.2013.6457595 ↗
26. J. Appl. Phys. · 1937 · 8 · 81510.1063/1.1710258 ↗
27. Proc. R. Soc. London, Ser. A · 1947 · 188 · 52110.1098/rspa.1947.0023 ↗
28. Phys. Rev. · 1949 · 76 · 137610.1103/physrev.76.1376 ↗
29. Proc. R. Soc. London, Ser. A · 1958 · 246 · 40610.1098/rspa.1958.0147 ↗
30. 1951
31. Proc. IEE, Part I · 1951 · 98 · 4410.1049/pi-1.1951.0019 ↗
32. Proc. IEE, Part IIA · 1953 · 100 · 14910.1049/pi-2a.1953.0024 ↗
33. Proc. IEE, Part C · 1955 · 102 · 25410.1049/pi-c.1955.0030 ↗
34. J. Inst. Electr. Eng. · 1951 · 23610.1049/jiee-2.1951.0102 ↗
35. J. Inst. Electr. Eng. · 1953 · 23410.1049/jiee-2.1953.0154 ↗
36. Proc. IEE, Part A · 1957 · 104 · 12310.1049/pi-a.1957.0032 ↗
37. J. Inst. Electr. Eng. · 1955 · 1 · 65310.1049/jiee-3.1955.0250 ↗
38. Nature · 1955 · 176 · 122510.1038/1761225a0 ↗
39. Theoretical calculation on formative time lag in polymer breakdown on a nanosecond time scale
40. Proc. IEEE · 1992 · 80 · 93410.1109/5.149456 ↗
41. 1970
42. 1966
43. IEEE Trans. Electr. Insul. · 1987 · EI-22 · 51710.1109/tei.1987.298918 ↗
44. 1972 · 76
45. 2007
46. Appl. Phys. Lett. · 2012 · 101 · 13290610.1063/1.4755841 ↗
47. J. Appl. Phys. · 1984 · 55 · 75210.1063/1.333133 ↗
48. Electrical conduction and breakdown in insulating polymers
49. 2004
50. IEEE Trans. Dielectr. Electr. Insul. · 2002 · 9 · 86010.1109/tdei.2002.1038669 ↗
51. IEEE Trans. Dielectr. Electr. Insul. · 2002 · 9 · 48310.1109/tdei.2002.1024425 ↗
52. 1992
53. J. Phys. D: Appl. Phys. · 2000 · 33 · L10910.1088/0022-3727/33/19/103 ↗
54. IEEE Trans. Electr. Insul. · 1984 · EI-19 · 22710.1109/tei.1984.298753 ↗
55. IEEE Trans. Dielectr. Electr. Insul. · 1997 · 4 · 49610.1109/94.625642 ↗
56. Phys. Rev. B · 1993 · 48 · 1626110.1103/physrevb.48.16261 ↗
57. 2006
58. IEEE Trans. Dielectr. Electr. Insul. · 2011 · 18 · 84710.1109/tdei.2011.5931074 ↗
59. IEEE Trans. Dielectr. Electr. Insul. · 2005 · 12 · 85710.1109/tdei.2005.1522182 ↗
60. IEEE Trans. Dielectr. Electr. Insul. · 2001 · 8 · 74410.1109/94.959693 ↗
61. IEEE Trans. Dielectr. Electr. Insul. · 2009 · 16 · 23210.1109/tdei.2009.4784572 ↗
62. Appl. Phys. Lett. · 2012 · 100 · 22290410.1063/1.4721809 ↗
63. IEEE Trans. Dielectr. Electr. Insul. · 2017 · 24 · 55910.1109/tdei.2016.005811 ↗
64. IEEE Trans. Dielectr. Electr. Insul. · 2019 · 26 · 4310.1109/tdei.2018.007413 ↗
65. IEEJ Trans. Fundam. Mater. · 1973 · 93 · 31310.1541/ieejfms1972.93.313 ↗
66. IEEJ Trans. Fundam. Mater. · 1974 · 94 · 25110.1541/ieejfms1972.94.251 ↗
67. IEEE Trans. Electr. Insul. · 1982 · EI-17 · 22810.1109/tei.1982.298460 ↗
68. 1988 · 355
69. Tech. Phys. · 2003 · 48 · 4810.1134/1.1538726 ↗
70. Rev. Sci. Instrum. · 2013 · 84 · 10511410.1063/1.4826295 ↗
71. IEEE Trans. Plasma Sci. · 2011 · 39 · 161310.1109/tps.2011.2143435 ↗
72. IEEE Trans. Dielectr. Electr. Insul. · 2012 · 19 · 110110.1109/tdei.2012.6259976 ↗
73. Phys. Plasmas · 2013 · 20 · 08211910.1063/1.4818437 ↗
74. 1992
75. A formula to calculate solid dielectric breakdown strength based on a model of electron impact ionization and multiplication10.1063/1.5110271 ↗
76. Phys. Rev. · 1950 · 79 · 52610.1103/physrev.79.526 ↗
77. Phys. Rev. · 1941 · 59 · 82010.1103/physrev.59.820 ↗
78. IEEE Trans. Electr. Insul. · 1980 · EI-15 · 20610.1109/tei.1980.298314 ↗
79. Proc. Inst. Electr. Eng. · 1966 · 113 · 146810.1049/piee.1966.0246 ↗
80. 1970
81. IEEE Trans. Dielectr. Electr. Insul. · 2011 · 18 · 103810.1109/tdei.2011.5976093 ↗
82. Laser Part. Beams · 2014 · 32 · 19710.1017/s0263034613000918 ↗
83. IEEE Trans. Dielectr. Electr. Insul. · 2016 · 23 · 231910.1109/tdei.2016.7556509 ↗
84. Chin. Phys. B · 2012 · 21 · 03310210.1088/1674-1056/21/3/033102 ↗
85. 2003
86. 1981
87. 1989 · 259
88. 2007 · 857
89. IEEE Trans. Electr. Insul. · 1989 · 24 · 58110.1109/14.34192 ↗
90. Phys. Rev. Spec. Top.–Accel. Beams · 2005 · 8 · 05040110.1103/PhysRevSTAB.8.050401 ↗
91. Research into pulse width effect on electric breakdown strength of polymers under nanosecond pulses
92. J. Appl. Mech. · 1951 · 18 · 293
93. J. Appl. Polym. Sci. · 2003 · 89 · 341610.1002/app.12511 ↗
94. IEEE Trans. Electr. Insul. · 1982 · 171 · 22110.1109/tei.1982.298459 ↗
95. 1982 · 300
96. IEEE Trans. Electr. Insul. · 1985 · EI-20 · 29310.1109/tei.1985.348833 ↗
97. IEEE Trans. Dielectr. Electr. Insul. · 2014 · 21 · 31710.1109/tdei.2013.004167 ↗