Effect of DC bias on electrical conductivity of nanocrystalline α-CuSCN
Source abstract
Abstract
The grain boundary space charge depletion layer in nanocrystalline alpha phase CuSCN is investigated by studying electrical properties using impedance spectroscopic analysis in frequency domain. The measurements were performed at room temperature in wide frequency range 1 Hz to 1 MHz under various DC bias applied voltages ranges from 0 V to -2.1 V. The effect of bias on grain and grain boundary contribution electrical conductivity has been investigated by equivalent circuit model using non-linear least squares (NLLS) fitting of the impedance data. Three order of magnitude variation of grain boundary conductivity was observed for varying 0 V to -2.1 V. Variations in the σac clearly elucidate the DC bias is playing crucial role on grain boundary double Schottky barriers of nanocrystalline α-CuSCN.
Source: crossref · Quality: baseline
Research context
OpenAlex topics: Dielectric properties of ceramics · Ferroelectric and Piezoelectric Materials · Microwave Dielectric Ceramics Synthesis
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
Affiliations
Chettinad Hospital and Research Institute Kelambakkam 1 Department of Medical Bionanotechnology, , Tamil Nadu 603103, India
Anna University 2 Crystal Growth Center, , Chennai 600 025, India
Indian Institute of Technology Madras 3 Department of Metallurgical and Materials Engineering, , Chennai 600 036, India
References (27)
Show source-provided references
1. Thin Solid Films · 2007 · 515 · 600010.1016/j.tsf.2006.12.125 ↗
2. Adv. Mater · 2005 · 17 · 151210.1002/adma.200401848 ↗
3. Adv. Mater · 2000 · 12 · 126310.1002/1521-4095(200009)12:17<1263::AID-ADMA1263>3.0.CO;2-T ↗
4. Phys. Stat. Solidi (a) · 1987 · 103 · 49110.1002/pssa.2211030220 ↗
5. Thin Solid Films · 2004 · 451 · 12810.1016/j.tsf.2003.11.002 ↗
6. J. Phys. Chem. B · 2002 · 106 · 534610.1021/jp020024n ↗
7. Mater. Letters · 2005 · 59 · 84210.1016/j.matlet.2004.10.063 ↗
8. J. Appl. Phys. · 2007 · 102 · 10410410.1063/1.2815633 ↗
9. J. Phys. Chem. Solids · 1969 · 30 · 265710.1016/0022-3697(69)90039-0 ↗
10. Macdonald · 1987
11. Solid State Ionics · 1999 · 123 · 27110.1016/S0167-2738(99)00103-4 ↗
12. J. Phys. Chem. Solids · 2001 · 62 · 99110.1016/S0022-3697(01)00041-5 ↗
13. J. Non-Crys. Solids · 1975 · 18 · 17310.1016/0022-3093(75)90019-8 ↗
14. J. Phys. Chem. Solids · 2003 · 64 · 65910.1016/S0022-3697(02)00368-2 ↗
15. Vacuum · 2004 · 77 · 293
16. Nanotechnology · 2006 · 17 · 175210.1088/0957-4484/17/6/035 ↗
17. Phys. Rev. B · 2006 · 73 · 09412410.1103/PhysRevB.73.094124 ↗
18. Phys. Rev. B · 2007 · 75 · 01210410.1103/PhysRevB.75.012104 ↗
19. Appl. Phys. Lett. · 2006 · 88 · 07290210.1063/1.2172739 ↗
20. J. Appl. Phys. · 1979 · 50 · 341410.1063/1.326334 ↗
21. J. Mater. Res. · 1995 · 10 · 229510.1557/JMR.1995.2295 ↗
22. IEEE Trans. Magn. · 1993 · 29 · 352010.1109/20.281216 ↗
23. J. Appl. Cryst. · 1994 · 27 · 43210.1107/S0021889893012610 ↗
24. Electrochemical and Solid State Lett. · 2005 · 8 · J110.1149/1.1830393 ↗
25. J. Phys. C: Solid State Phys. · 1985 · 18 · 407910.1088/0022-3719/18/21/008 ↗
26. Solid State Electronics · 1983 · 26 · 106910.1016/0038-1101(83)90004-7 ↗
27. J. Appl. Phys. · 1988 · 64 · 245610.1063/1.341681 ↗