journal article·2015-06-01Open access

Electromagnetic interference shielding effectiveness of composite carbon nanotube macro-film at a high frequency range of 40 GHz to 60 GHz

Zi Ping Wu, De Ming Cheng, Wen Jing Ma, Jing Wei Hu, Yan Hong Yin, Ying Yan Hu, Ye Sheng Li, Jian Gao Yang, Qian Feng Xu

AIP Advances· Volume 5· Issue 6

Abstract

The electromagnetic interference (EMI) shielding effectiveness (SE) of carbon nanotube (CNT) macro-film that is adhered to common cloth to maintain the light weight, silk-like quality, and smooth surface of the material for EMI shielding is investigated. The results show that a high and stable EMI SE of 48 dB to 57 dB at 40 GHz to 60 GHz was obtained by the macro-film with a thickness of only ∼4 μm. The composite CNT macro-film is easily manipulated, and its EMI property is significantly different from that of traditional electromagnetic shielding materials that show a lower EMI SE with increasing frequency. For example, the EMI SE of Cu foils decrease from 75 dB to 35 dB as frequency increases from 25 GHz to 60 GHz. Considering their stable and outstanding EMI SE and easy manipulation, the composite CNT macro-films are expected to have potential applications in shielding against millimeter waves.
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Research context

OpenAlex topics: Electromagnetic wave absorption materials · Advanced Antenna and Metasurface Technologies · Electromagnetic Compatibility and Measurements

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

Affiliations

Jiangxi University of Science and Technology 1 School of Materials Science and Engineering, , 86 Hong Qi Road, Ganzhou 341000, P. R. China

State Key Lab of Millimeter Waves 2 , 2 Si Pai Lou, Nanjing 210096, P. R. China

City University of New York 3 Chemistry Department, College of Staten Island, , 2800 Victory Boulevard, New York, 10314, United States

Funding

National Natural Science Foundation of China

References (30)

Show source-provided references
1. Proc. IEEE. · 1985 · 73 · 38810.1109/PROC.1985.13164 ↗
2. Semiconductor Components Industries · 2011 · 1
3. Mater. Trans. · 2008 · 49 · 65510.2320/matertrans.MER2007252 ↗
4. Crit. Rev. Bio. Eng. · 2001 · 29 · 44010.1615/CritRevBiomedEng.v29.i3.80 ↗
5. 2012
6. Adv. Mater. · 2005 · 17 · 199910.1002/adma.200500615 ↗
7. Carbon · 2003 · 41 · 265310.1016/S0008-6223(03)00292-6 ↗
8. Appl. Phys. Lett. · 2005 · 87 · 12310310.1063/1.2051806 ↗
9. Adv. Funct. Mater. · 2008 · 18 · 299510.1002/adfm.200701406 ↗
10. Nano Lett. · 2005 · 5 · 213110.1021/nl051375r ↗
11. J. Appl. Phys. · 2008 · 103 · 1241033
12. Adv. Mater. · 2004 · 16 · 40110.1002/adma.200306460 ↗
13. Carbon · 2009 · 47 · 267010.1016/j.carbon.2009.05.017 ↗
14. Carbon · 1996 · 34 · 129310.1016/0008-6223(96)82798-9 ↗
15. Carbon · 2010 · 48 · 78810.1016/j.carbon.2009.10.028 ↗
16. Carbon · 2013 · 56 · 8610.1016/j.carbon.2012.12.081 ↗
17. Scripta Mater. · 2011 · 64 · 80910.1016/j.scriptamat.2011.01.002 ↗
18. Physica E · 2009 · 42 · 7710.1016/j.physe.2009.09.003 ↗
19. IEEE Trans. Instrum. Meas. · 1992 · 41 · 29110.1109/19.137363 ↗
20. Appl. Phys. Lett. · 1994 · 65 · 227810.1063/1.112717 ↗
21. 1998
22. Polym Plast. Technol. Eng. · 1981 · 17 · 110.1080/03602558108067695 ↗
23. Paysica · 1948 · 14 · 207
24. Phys. Rev. B · 1999 · 60 · 1713610.1103/PhysRevB.60.17136 ↗
25. Phys. Rev. B · 2009 · 79 · 15540310.1103/PhysRevB.79.155403 ↗
26. J. Appl. Phys. · 2010 · 108 · 11430210.1063/1.3516480 ↗
27. Phys. Rev. B · 2013 · 88 · 04543610.1103/PhysRevB.88.045436 ↗
28. J. Math. Phys. · 1961 · 2 · 51210.1063/1.1703737 ↗
29. Prz. Elektrotechnicz. · 2012 · 6 · 81
30. Appl. Phys. Lett. · 2008 · 93 · 17290310.1063/1.3009200 ↗