journal article·2024-08-01Open access

Modeling swift heavy ion irradiation of substrate-supported two-dimensional material via two-temperature molecular dynamics simulations

Tan Shi, Xiqiang Xu, Hao Wan, Pei Jia, Ping Zhang, Huan He, Rui Gao, Chenyang Lu

AIP Advances· Volume 14· Issue 8

Abstract

This study employs two-temperature molecular dynamics simulations to investigate swift heavy ion irradiation of SiO2 substrate-supported two-dimensional material graphene. Material-dependent electronic and thermal properties are integrated into each region to model the energy transfer between the electronic and atomic subsystems of the studied materials. Simulations of interactions with Xe heavy ions are performed with ion kinetic energies ranging from 0.5 to 25 GeV with electronic stopping powers from ∼2.6 to 17.7 keV/nm. With the studied ion energy range, nanopores with a diameter of up to 5 nm can be formed in graphene due to the thermally driven sputtering effect, while amorphization occurs along the ion track in the SiO2 substrate. The coupling between the substrate and two-dimensional material significantly impacts the structural change due to heat transfer and atomic interactions among different layers of materials. The method applied in this work provides a valuable tool for modeling and understanding the structural modifications induced by ion irradiation in layered structures.
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Research context

OpenAlex topics: Graphene research and applications · Ion-surface interactions and analysis · Nanopore and Nanochannel Transport Studies

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

Affiliations

School of Nuclear Science and Technology, Xi’an Jiaotong University 1 , Xi’an 710049, China

School of Mechanical and Electrical Engineering, Taizhou University 2 , Taizhou 225300, China

Testing Center Division, the 58th Research Institute of China Electronics Technology Group Corporation 3 , Wuxi 210000, China

State Key Laboratory of Multiphase Flow in Power Engineering, Xi’an Jiaotong University 4 , Xi’an 710049, China

Funding

National Natural Science Foundation of China · Wuxi Key Laboratory of Integrated Circuit Testing and Reliability · The Computing Center of Xi’an

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