Total ionization dose and electromagnetic pulse synergistic effects on low dropout linear regulator

As a power management chip widely used in various electronic systems, the low dropout regulator (LDO) plays a crucial role in the normal operation of electronic systems. Ionizing radiation and electromagnetic pulse (EMP) radiation can cause interference and damage to the LDO, posing risks to the proper functioning of electronic systems in large-scale scientific devices. In this study, through separate experimental investigations on the Total Ionizing Dose (TID) effects, EMP effects, and synergistic effect of the LDO, it was found that parameters such as the LDO output voltage decreases with increasing irradiation dose, with more severe degradation observed under grounded bias. The EMP effects mainly cause oscillations in the LDO output voltage and a slight increase in its mean value. The results of the synergistic effect experiments indicate that there is a certain synergistic interaction between the TID effects and the EMP effects. The synergistic effects lead to an increase in the amplitude of the oscillations and changes in the mean value of the output voltage.