Physical model for the frequency dependence of time-dependent dielectric breakdown (TDDB)
Source abstract
Abstract
A molecular physics-based model is presented for understanding the frequency dependence of time-dependent dielectric breakdown (TDDB). The fundamental physics behind the frequency dependence comes from the relative dielectric constant ɛr, which is known to be frequency dependent. A small fractional power-law decrease in dielectric constant with frequency produces a lower local electric field with a significant improvement in TDDB lifetime with frequency.
Source: crossref · Quality: baseline
Research context
OpenAlex topics: Semiconductor materials and devices · Molecular Junctions and Nanostructures · Electronic and Structural Properties of Oxides
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
Affiliations
McPherson Reliability Consulting LLC , 2805 Shelton Way, Plano, Texas 75093, USA
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