Atomic-scale epitaxial aluminum film on GaAs substrate
Source abstract
Abstract
Atomic-scale metal films exhibit intriguing size-dependent film stability, electrical conductivity, superconductivity, and chemical reactivity. With advancing methods for preparing ultra-thin and atomically smooth metal films, clear evidences of the quantum size effect have been experimentally collected in the past two decades. However, with the problems of small-area fabrication, film oxidation in air, and highly-sensitive interfaces between the metal, substrate, and capping layer, the uses of the quantized metallic films for further ex-situ investigations and applications have been seriously limited. To this end, we develop a large-area fabrication method for continuous atomic-scale aluminum film. The self-limited oxidation of aluminum protects and quantizes the metallic film and enables ex-situ characterizations and device processing in air. Structure analysis and electrical measurements on the prepared films imply the quantum size effect in the atomic-scale aluminum film. Our work opens the way for further physics studies and device applications using the quantized electronic states in metals.
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Research context
OpenAlex topics: Surface and Thin Film Phenomena · Semiconductor materials and devices · Electronic and Structural Properties of Oxides
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
Affiliations
Department of Electronics Engineering, National Chiao Tung University 1 , Hsinchu, Taiwan
Department of Electronic Engineering, National Changhwa University of Education 2 , Changhwa, Taiwan
Department of Physics, National Taiwan University 3 , Taipei, Taiwan
Funding
Ministry of Science and Technology, Taiwan · Ministry of Education
References (25)
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