Continuous and discrete phasor analysis of binned or time-gated periodic decays
Source abstract
Abstract
The time-resolved analysis of periodically excited luminescence decays by the phasor method in the presence of time-gating or binning is revisited. Analytical expressions for discrete configurations of square gates are derived, and the locus of the phasors of such modified periodic single-exponential decays is compared to the canonical universal semicircle. The effects of instrument response function offset, decay truncation, and gate shape are also discussed. Finally, modified expressions for the phase and modulus lifetimes are provided for some simple cases. A discussion of a modified phasor calibration approach is presented, and an illustration of the new concepts with examples from the literature concludes this work.
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Research context
OpenAlex topics: Semiconductor materials and devices · Integrated Circuits and Semiconductor Failure Analysis · Terahertz technology and applications
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
Affiliations
Department of Chemistry and Biochemistry , 607 Charles E. Young Drive E., Los Angeles, California 90095, USA
Funding
Human Frontier Science Program · National Institute of General Medical Sciences · National Cancer Institute · U.S. Department of Energy · UC Cancer Research Coordinating Committee · ERC Horizon 2020 · France-US Partner University Fund
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