Thickness dependent exchange bias in martensitic epitaxial Ni-Mn-Sn thin films
Source abstract
Abstract
A thickness dependent exchange bias in the low temperature martensitic state of epitaxial Ni-Mn-Sn thin films is found. The effect can be retained down to very small thicknesses. For a Ni50Mn32Sn18 thin film, which does not undergo a martensitic transformation, no exchange bias is observed. Our results suggest that a significant interplay between ferromagnetic and antiferromagnetic regions, which is the origin for exchange bias, is only present in the martensite. The finding is supported by ab initio calculations showing that the antiferromagnetic order is stabilized in the phase.
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Research context
OpenAlex topics: Shape Memory Alloy Transformations · Magnetic Properties and Applications · Magnetic and transport properties of perovskites and related materials
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
Affiliations
Institute for Complex Materials 1 IFW Dresden, , P.O. Box 27 01 16, 01171 Dresden, Germany
Dresden University of Technology 2 Department of Physics, Institute for Solid State Physics, , 01062 Dresden, Germany
Bielefeld University 3 Department of Physics, Thin Films and Physics of Nanostructures, , 33501 Bielefeld, Germany
Max-Planck Institut für Eisenforschung 4 , 40237 Düsseldorf, Germany
Dresden University of Technology 5 Institute of Materials Science, , 01062 Dresden, Germany
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