journal article·2016-11-01Open access

Particle sedimentation monitoring in high-concentration slurries

Yoshihiro Nagasawa, Zenji Kato, Satoshi Tanaka

AIP Advances· Volume 6· Issue 11

Abstract

In this study, the sedimentation states of particles in high-concentration slurries were elucidated by monitoring their internal states. We prepared transparent high-concentration silica slurries by adjusting the refractive index of the aqueous glycerol liquid in which the particles were dispersed to match that of the silica particles. In addition, a fluorescent dye was dissolved in the liquid. Then, we directly observed the individual and flocculated particles in the slurries during sedimentation by confocal laser scanning fluorescent microscopy. The particles were found to sediment very slowly while exhibiting fluctuating motion. The particle sedimentation rate in the high-concentration slurry with the aqueous glycerol solution (η=0.068Pa·s) and a particle volume fraction on the order of 0.3 was determined to be 1.58 ± 0.66 μm·min−1 on the basis of the obtained image sequences for 24.9 h. In-situ observation provides a large amount of information about the sedimentation behavior of particles in condensed matter.
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Research context

OpenAlex topics: Material Dynamics and Properties · Surfactants and Colloidal Systems · Pickering emulsions and particle stabilization

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

Affiliations

Nagaoka University of Technology , 1603-1 Kamitomioka, Nagaoka, Niigata 940-2188, Japan

Funding

The Materials and Structures Laboratory in Tokyo Institute of Technology

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