journal article·2016-09-01Open access

Field emission characteristics of a small number of carbon fiber emitters

Wilkin W. Tang, Donald A. Shiffler, John R. Harris, Kevin L. Jensen, Ken Golby, Matthew LaCour, Tim Knowles

AIP Advances· Volume 6· Issue 9

Abstract

This paper reports an experiment that studies the emission characteristics of small number of field emitters. The experiment consists of nine carbon fibers in a square configuration. Experimental results show that the emission characteristics depend strongly on the separation between each emitter, providing evidence of the electric field screening effects. Our results indicate that as the separation between the emitters decreases, the emission current for a given voltage also decreases. The authors compare the experimental results to four carbon fiber emitters in a linear and square configurations as well as to two carbon fiber emitters in a paired array. Voltage-current traces show that the turn-on voltage is always larger for the nine carbon fiber emitters as compared to the two and four emitters in linear configurations, and approximately identical to the four emitters in a square configuration. The observations and analysis reported here, based on Fowler-Nordheim field emission theory, suggest the electric field screening effect depends critically on the number of emitters, the separation between them, and their overall geometric configuration.
Source: crossref · Quality: baseline

Research context

OpenAlex topics: Carbon Nanotubes in Composites · Graphene research and applications · Electrostatic Discharge in Electronics

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

Affiliations

1Air Force Research Laboratory/Directed Energy Directorate, Albuquerque, New Mexico 87117, USA

2Code 6364, Naval Research Laboratory, Washington, DC 20375, USA

3Leidos, Inc., Albuquerque, New Mexico 87117, USA

4Energy Science Laboratories, Inc., San Diego, California 92121, USA

Funding

Air Force Office of Scientific Research

References (31)

Show source-provided references
1. J. Vac. Sci. Technol., B · 1998 · 16 · 75810.1116/1.589898 ↗
2. Appl. Phys. Lett. · 2001 · 78 · 129410.1063/1.1351847 ↗
3. Phys. Med. Biol. · 2009 · 54 · 232310.1088/0031-9155/54/8/005 ↗
4. Nanotechnology · 2009 · 20 · 32570710.1088/0957-4484/20/32/325707 ↗
5. IEEE Trans. Plasma Sci. · 2002 · 28 · 727
6. Phys. Plasmas · 1999 · 6 · 224110.1063/1.873502 ↗
7. IEEE Trans. Electron Devices · 1989 · 36 · 22510.1109/16.21210 ↗
8. Appl. Phys. Lett. · 2002 · 81 · 32310.1063/1.1489084 ↗
9. J. Appl. Phys. · 1999 · 86 · 39983
10. J. Appl. Phys. · 2003 · 93 · 560210.1063/1.1564882 ↗
11. Appl. Phys. Lett. · 2000 · 76 · 207110.1063/1.126258 ↗
12. Appl. Phys. Lett. · 2002 · 80 · 239210.1063/1.1465109 ↗
13. J. Appl. Phys. · 2011 · 110 · 03490510.1063/1.3615846 ↗
14. J. Vac. Sci. Technol. B · 2012 · 30 · 06180310.1116/1.4759254 ↗
15. IEEE Trans. Plasma Sci. · 2014 · 42 · 100
16. J. Vac. Sci. Technol. B · 2014 · 32 · 05220210.1116/1.4891928 ↗
17. AIP Advances · 2015 · 5 · 08718210.1063/1.4929983 ↗
18. J. Vac. Sci. Technol. B · 2016 · 34 · 04121510.1116/1.4953076 ↗
19. J. Appl. Phys. · 2016 · 119 · 04330110.1063/1.4940410 ↗
20. IEEE Trans. Plasma Sci. · 2012 · 40 · 187110.1109/TPS.2012.2195328 ↗
21. Proc. R. Soc. London, Serv. A · 1928 · 119 · 17310.1098/rspa.1928.0091 ↗
22. Appl. Phys. Lett. · 2005 · 86 · 22311410.1063/1.1944229 ↗
23. Phys. Rev. · 1952 · 88 · 34910.1103/PhysRev.88.349 ↗
24. J. Vac. Sci. Technol. B · 1999 · 17 · 53410.1116/1.590589 ↗
25. Ultramicroscopy · 1999 · 7 · 1110.1016/S0304-3991(99)00097-2 ↗
26. Phys. Rev. Letts · 2002 · 89 · 19760210.1103/PhysRevLett.89.197602 ↗
27. Nanotechnology · 2011 · 22 · 09560210.1088/0957-4484/22/9/095602 ↗
28. J. Vac. Sci. Technol. B · 2005 · 23 · 2362
29. Appl. Phys. Letts · 2007 · 91 · 07410510.1063/1.2771375 ↗
30. J. Appl. Phys. · 2015 · 118 · 08330210.1063/1.4929364 ↗
31. J. Appl. Phys. · 2015 · 117 · 19490210.1063/1.4921186 ↗