Electrostatic properties of few-layer MoS2 films
Source abstract
Abstract
Two-dimensional MoS2-based materials are considered to be one of the most attractive materials for next-generation nanoelectronics. The electrostaticproperties are important in designing and understanding the performance of MoS2-based devices. By using Kelvin probe force microscopy, we show that few-layer MoS2 sheets exhibit uniform surface potential and charge distributions on their surfaces but have relatively lower surface potentials on the edges, folded areas as well as defect grain boundaries.
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Research context
OpenAlex topics: 2D Materials and Applications · Graphene research and applications · MXene and MAX Phase Materials
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
Affiliations
Xiangtan University 1 Hunan Key Laboratory for Micro-Nano Energy Materials and Devices, , Hunan 411105, P. R. China
Xiangtan University 2 Laboratory for Quantum Engineering and Micro-Nano Energy Technology and Faculty of Materials and Optoelectronic Physics, ,Hunan 411105, P. R. China
Funding
National Natural Science Foundation of China
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