journal article·2015-07-01Open access

Energy harvesting from vibration with cross-linked polypropylene piezoelectrets

Xiaoqing Zhang, Liming Wu, Gerhard M. Sessler

AIP Advances· Volume 5· Issue 7

Abstract

Piezoelectret films are prepared by modification of the microstructure of polypropylene foam sheets cross-linked by electronic irradiation (IXPP), followed by proper corona charging. Young’s modulus, relative permittivity, and electromechanical coupling coefficient of the fabricated films, determined by dielectric resonance spectra, are about 0.7 MPa, 1.6, and 0.08, respectively. Dynamic piezoelectric d33 coefficients up to 650 pC/N at 200 Hz are achieved. The figure of merit (FOM, d33 ⋅ g33) for a more typical d33 value of 400 pC/N is about 11.2 GPa−1. Vibration-based energy harvesting with one-layer and two-layer stacks of these films is investigated at various frequencies and load resistances. At an optimum load resistance of 9 MΩ and a resonance frequency of 800 Hz, a maximum output power of 120 μW, referred to the acceleration g due to gravity, is obtained for an energy harvester consisting of a one-layer IXPP film with an area of 3.14 cm2 and a seismic mass of 33.7 g. The output power can be further improved by using two-layer stacks of IXPP films in electric series. IXPP energy harvesters could be used to energize low-power electronic devices, such as wireless sensors and LED lights.
Source: crossref · Quality: baseline

Research context

OpenAlex topics: Innovative Energy Harvesting Technologies · Advanced Sensor and Energy Harvesting Materials · Dielectric materials and actuators

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

Affiliations

Tongji University 1 Shanghai Key Laboratory of Special Artificial Microstructure Materials and Technology & School of Physics Science and Engineering, , Shanghai 200092, China

Institute for Telecommunications Technology 2 , Merckstrasse 25, 64283 Darmstadt, Germany

Funding

Deutsche Forschungsgemeinschaft · National Natural Science Foundation of China

References (33)

Show source-provided references
2. Int. J. Precis. Eng. Manuf. · 2011 · 12 · 112910.1007/s12541-011-0151-3 ↗
3. Energy Environ. Sci. · 2014 · 7 · 2510.1039/C3EE42454E ↗
4. Comput. Commun. · 2003 · 26 · 113110.1016/S0140-3664(02)00248-7 ↗
5. Proc. IEEE · 2008 · 96 · 145710.1109/JPROC.2008.927494 ↗
6. 2011
7. Appl. Phys. Lett. · 2014 · 104 · 17290110.1063/1.4874305 ↗
8. J. Intell. Mater. Syst. Struct. · 2014 · 25 · 168110.1177/1045389X14541501 ↗
9. J. Appl. Phys. · 2014 · 116 · 07410910.1063/1.4893367 ↗
10. Appl. Phys. Lett. · 2012 · 100 · 26290110.1063/1.4730952 ↗
11. IEEE Trans. Dielectr. Electr. Insul. · 2015 · 22 · 134910.1109/TDEI.2015.7116321 ↗
12. IEEE Trans. Dielectr. Electr. Insul. · 2015 · 22 · 136010.1109/TDEI.2015.7116323 ↗
13. IEEE Trans. Dielectr. Electr. Insul. · 2015 · 22 · 147010.1109/TDEI.2015.7116339 ↗
14. Phys. Today · 2004 · 57 · 3710.1063/1.1688068 ↗
15. IEEE Trans. Dielectr. Electr. Insul. · 2006 · 13 · 95310.1109/TDEI.2006.247819 ↗
16. 1999 · 735-738
17. Appl. Phys. Lett. · 1999 · 75 · 340510.1063/1.125308 ↗
18. IEEE Trans. Dielectr. Electr. Insul. · 2002 · 9 · 85010.1109/TDEI.2002.1038668 ↗
19. Appl. Phys. Lett. · 2004 · 85 · 122610.1063/1.1781388 ↗
20. Macromol. Mater. Eng. · 2014 · 299 · 29010.1002/mame.201300161 ↗
21. Appl. Phys. Lett. · 2004 · 84 · 39210.1063/1.1641171 ↗
22. J. Appl. Phys. · 2010 · 108 · 01110110.1063/1.3457141 ↗
23. J. Appl. Phys. · 2006 · 99 · 02410210.1063/1.2161825 ↗
24. J. Appl. Phys. · 2009 · 106 · 01410610.1063/1.3159039 ↗
25. J. Appl. Phys. · 2007 · 101 · 05411410.1063/1.2562413 ↗
26. Appl. Phys. Lett. · 2007 · 91 · 18290110.1063/1.2803316 ↗
27. Appl. Phys. Lett. · 2000 · 77 · 382710.1063/1.1331348 ↗
28. IEEE Trans. Dielectr. Electr. Insul. · 2003 · 10 · 84210.1109/TDEI.2003.1237333 ↗
29. IEEE Trans. Dielectr. Electr. Insul. · 2000 · 7 · 53710.1109/94.868074 ↗
30. J. Appl. Phys. · 2001 · 90 · 348910.1063/1.1398597 ↗
31. IEEE Trans. Dielectr. Electr. Insul. · 2004 · 11 · 7210.1109/TDEI.2004.1266319 ↗
32. IEEE Trans. Dielectr. Electr. Insul. · 2001 · 8 · 62910.1109/94.946715 ↗
33. Appl. Phys. Lett. · 2013 · 103 · 12290410.1063/1.4821647 ↗