A review of subsurface damage detection methods for optical components
Source abstract
Abstract
Subsurface damage (SSD) induced during the processing of optical components, which are key parts of large optical systems, can deteriorate optical system performance or damage the complete system. To eliminate the SSD of optical components in subsequent processing, it must be accurately detected. This paper presents a review of the principle, characteristics, research status, and development trends of SSD detection methods for optical components. This review finds that destructive detection methods can damage the components and cannot detect SSD online, but they are reliable and accurate and characterized by facile principles, easy implementation, and inexpensive equipment. Consequently, such methods are widely used for the validation of non-destructive methods and quality control of components in industrial production. In comparison, non-destructive detection methods can detect SSD online without destroying the components, shorten the detection cycle, increase the overall production efficiency, and decrease the cost. Therefore, non-destructive detection methods have promising development prospects.
Source: crossref · Quality: baseline
Research context
OpenAlex topics: Advanced Surface Polishing Techniques · Integrated Circuits and Semiconductor Failure Analysis · Semiconductor materials and devices
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
Affiliations
School of Electronic and Information Engineering, Changchun University of Science and Technology 1 , Changchun 130022, China
Xi’an Key Laboratory of Active Photoelectric Imaging Detection Technology, Xi'an Technological University 2 , Xi’an 710021, China
Funding
Xi'an Key Laboratory of Photoelectric Imaging Detection Technology
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