journal article·2017-01-01Open access

First principles study of oxygen vacancy defects in amorphous SiO2

Yunliang Yue, Yu Song, Xu Zuo

AIP Advances· Volume 7· Issue 1

Abstract

The oxygen vacancy defects of amorphous SiO2 (a-SiO2) in different charge states are investigated by the periodic density functional theory. Five types of the positively charged configurations are obtained including the dimer, forward-oriented, puckered 4×, 5× and back-projected unpuckered configurations. The energy, geometry structure, spin density, Bader charge and Fermi contact are concerned for these systems. These defects can be regarded as the potential microscopic structures for the corresponding centers including Eα′, Eγ′ and Eδ′ in the electron paramagnetic resonance (EPR) experiments. Then, the charge-state transitions of these defects are investigated by intentionally adding one electron to the positively charged systems. For the dimer, puckered 4× and back-projected unpuckered configurations, all of the corresponding neutral species maintain their initial types of geometry structures. For the forward-oriented configurations, the corresponding neutral species transform into the structures of the divalent Si atom. The puckered 5× configurations have the most abundant neutral species: some of them could maintain its style of the puckered 5× configurations, and some collapse to the neutral dimer or forward-oriented configurations. The dimer configurations have the lowest thermodynamic charge-state levels, and the puckered 4× configurations have the highest thermodynamic charge-state levels among the five types of configurations. This work is of benefit to identifying and controlling the oxygen defects in a-SiO2.
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Research context

OpenAlex topics: Glass properties and applications · Semiconductor materials and devices · Luminescence Properties of Advanced Materials

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

Affiliations

Nankai University 1 College of Electronic Information and Optical Engineering, , Tianjin 300071, China

China Academy of Engineering Physics 2 Microsystems and Terahertz Research Center, , Chengdu 610200, People’s Republic of China

China Academy of Engineering Physics 3 Institute of Electronic Engineering, , Mianyang 621999, People’s Republic of China

Nankai University 4 Municipal Key Laboratory of Photo-electronic Thin Film Devices and Technology, , Tianjin 300071, China

Funding

the CAEP Microsystem and THZ science and Technology Foundation, China · the National Basic Research Program of China · the Science Challenge Project, China

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