A Universal Approach to Enhancing Silicon Hot‐Carrier Photodetectors for CMOS‐Compatible SWIR Imaging (Adv. Sci. 38/2026)

Silicon Hot-Carrier Photodetectors Silicon hot-carrier photodetectors offer a CMOS-compatible pathway toward SWIR imaging applications but typically suffer from low quantum efficiency. The image illustrates how the proposed quasi-generalized antireflection coating enhances optical absorption, leading to improved quantum efficiency. More details can be found in the Research Article by Min-Chul Park, In-Ho Lee, and co-workers (DOI: 10.1002/advs.75474).