TRIM: Simultaneous Thermometry, Ranging, and Imaging via a Monolithic Metalens
Source abstract
Abstract
ABSTRACT While metasurfaces offer a pathway beyond the discrete architectures of conventional LWIR systems, physically fusing high‐precision thermometry and passive ranging onto a single metalens remains a formidable challenge. Here, we demonstrate a monolithic, dual‐focus metalens capable of simultaneous multidimensional sensing. By multiplexing two distinct focal lengths into a single metasurface, the system enables the parallel acquisition of spectral and spatial information. For thermal sensing, we implement a dual‐band (9.6 and 10.6 µm) ratiometric method that effectively mitigates target emissivity uncertainty under the gray‐body assumption. This approach yields a mean absolute temperature error of 13.58°C (∼3% relative error) and exhibits exceptional linearity (R 2 > 0.916) across 100°C–450°C. Concurrently, the dual‐focus architecture facilitates passive depth acquisition by capturing differential defocus signatures. A depth retrieval model based on the normalized defocus response establishes a robust linear relationship with inverse depth (R 2 = 0.916), with measurement deviations primarily confined within the 95% confidence interval across the 15–25 cm range. Our approach opens a pathway for transitioning from discrete sensors to monolithic, chip‐scale intelligent perception platforms, enhancing simultaneous thermometry and ranging for remote targets without compromising diffraction‐limited imaging performance.
Source: crossref · Quality: baseline
Research context
OpenAlex topics: Metamaterials and Metasurfaces Applications · Thermal Radiation and Cooling Technologies · Photoacoustic and Ultrasonic Imaging
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
Affiliations
College of Science National University of Defense Technology Changsha China
School of Physical Science and Technology Southwest University Chongqing China
State Key Laboratory of Precision Measurement Technology and Instruments Department of Precision Instrument Tsinghua University Beijing China
Funding
National Key Research and Development Program of China · National Natural Science Foundation of China
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