Hot Holes: In Situ Visualization of Localized Surface Plasmon Resonance‐Driven Hot Hole Flux (Adv. Sci. 20/2020)
Source abstract
Abstract
In article number 2001148, Moonsang Lee, Jeong Young Park, and co‐workers demonstrate that fast‐disappearing hot holes are directly visualized using photoconductive atomic force microscopy. Experimental and numerical analysis show that hot spots at the edge of plasmonic nanostructures of Au nanoprisms on p‐type GaN exhibit enhanced hot hole flux driven by surface plasmons. [Image: see text]
Source: openalex_inverted_index · Quality: baseline
Research context
OpenAlex topics: GaN-based semiconductor devices and materials · Thin-Film Transistor Technologies · Advancements in Semiconductor Devices and Circuit Design
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