Application of Synchrotron Radiation Based X‐Ray Diffraction in Zeolite Research: Advanced Analysis from Atomic Structure to Dynamic Behavior

Abstract Zeolites, as crystalline materials with regular pore channels, are widely utilized in energy, environmental, and advanced manufacturing sectors. Characterizing zeolites is crucial for understanding their structure and properties, which are essential for various applications. Synchrotron Radiation‐based X‐ray Diffraction (SR‐XRD) has become an advanced tool in zeolite research, providing higher resolution, faster scans, and more precise structural information than laboratory X‐ray diffraction methods. This technique allows for detailed studies, from atomic structures to dynamic behaviors, particularly in understanding structural evolution during synthesis and monitoring changes in the framework during reactions. Moreover, SR‐XRD has made significant contributions to catalytic research by revealing structural alterations during catalytic processes and identifying active sites. However, SR‐XRD still faces challenges in data interpretation and other technological limitations. To overcome these, integrating SR‐XRD with other techniques and using AI‐assisted analysis are expected to further advance zeolite characterization and catalytic research.