Total Internal Reflection Geometry: Exploiting Total Internal Reflection Geometry for Terahertz Devices and Enhanced Sample Characterization (Advanced Optical Materials 3/2020)
Source abstract
Abstract
Total Internal Reflection (TIR) geometry has been exploited to improve terahertz modulation efficiency and enhance characterization sensitivity. This cover illustrates three examples, namely, fast modulation by graphene (lower prism), spatial modulation by optically pumping the silicon (middle prism), and highly sensitive spectroscopy of the perovskite degradation process (top prism). More applications can be found in article number 1900535 by Emma Pickwell-MacPherson and co-workers.
Source: openalex_inverted_index · Quality: baseline
Research context
OpenAlex topics: Photonic and Optical Devices · Optical and Acousto-Optic Technologies
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Affiliations
Department of Electronic Engineering The Chinese University of Hong Kong, Hong Kong Shatin, N.T. Hong Kong 999077 China
National‐Regional Key Technology Engineering Laboratory for Medical Ultrasound Guangdong Key Laboratory for Biomedical Measurements and Ultrasound Imaging Department of Biomedical Engineering School of Medicine Shenzhen University Shenzhen 518060 China
Physics Department University of Warwick Coventry CV4 7AL UK
References
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