DataVXAdvanced Optical MaterialsPaper
journal article·2023-10Open access

Cs3Cu2I5 Single Crystal for Efficient Direct X‐Ray Detection (Advanced Optical Materials 19/2023)

Qinhua Wei, Xiongsheng Fan, Peng Xiang, Laishun Qin, Wenjun Liu, Tongyu Shi, Hang Yin, Peiqing Cai, Yufeng Tong, Gao Tang, Zugang Liu, Paul K. Chu, Hongsheng Shi, Yanliang Liu, Xue‐Feng Yu

Advanced Optical Materials· Volume 11· Issue 19
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Source abstract

Abstract

Cs3Cu2I5 Single Crystal for Efficient Direct X-Ray Detection In article number 2300247, Laishun Qin, Hongsheng Shi, Yanliang Liu, Xue-Feng Yu, and colleagues demonstrate a high-quality Li-doped Cs3Cu2I5 single crystal grown by the Bridgman method that was initially applied as a semiconductor for direct X-ray detection. The Cs3Cu2I5:Li X-ray detector exhibits a high sensitivity of 831.1 µC Gyair−1 cm−2 and low detection limit of 34.8 nGyair s−1, and it reveals a clear outline of the key image in the scanning mode under X-ray excitation.
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Research context

Electronic materials

OpenAlex topics: Luminescence Properties of Advanced Materials

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Affiliations

College of Materials and Chemistry China Jiliang University Hangzhou 310018 China

Materials Interfaces Center Shenzhen Institute of Advanced Technology Chinese Academy of Sciences Shenzhen Guangdong 518055 China

College of Optical and Electronic Technology China Jiliang University Hangzhou 310018 China

State Key Laboratory of Molecular Reaction Dynamics Dalian Institute of Chemical Physics Chinese Academy of Science Dalian 116023 China

Department of Physics Department of Materials Science and Engineering and Department of Biomedical Engineering City University of Hong Kong Tat Chee Avenue, Kowloon Hong Kong 999077 China

Xinjiang Technical Institute of Physics and Chemistry Chinese Academy of Sciences Urumqi 830011 China

References

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