Source abstract
Abstract
Abstract Nanocrystals (NCs) have reached a high level of maturity, enabling their integration into optoelectronic devices. The next challenge is the combination of several types of devices into one complex system to achieve better on‐chip integration. Here, an all‐HgTe‐NC active imaging setup operating in the short‐wave infrared (IR) is focused on. First, the design of an optimized IR light‐emitting diode (LED) is focused on. It is shown that a halide technology processing enables an increase of the electroluminescence signal by a factor of 3, while preserving a low turn‐on voltage and a high brightness (3 W sr −1 m −2 ). Then the degradation mechanism of this LED under continuous operation is unveiled and a shift from band edge to trap emission is shown. This degradation process can be strongly reduced thanks to the encapsulation and the thermal control of the LED. Lastly, the IR emission of the LED is imaged using a focal plane array whose active layer is also made of HgTe NCs, paving the way for all‐NC‐based active imaging setups.
Source: crossref · Quality: baseline
Research context
OpenAlex topics: Quantum Dots Synthesis And Properties · Chalcogenide Semiconductor Thin Films · Perovskite Materials and Applications
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
Affiliations
Institut des NanoSciences de Paris (INSP) CNRS Sorbonne Université Paris F‐75005 France
New Imaging Technologies SA 1 impasse de la Noisette Verrières le Buisson 91370 France
Laboratoire de Physique et d'Etude des Matériaux, CNRS UMR 8213 ESPCI‐Paris PSL Research University Sorbonne Université Univ Paris 06 10 rue Vauquelin Paris 75005 France
Centre de MicroCaractérisation Raimond Castaing UAR3623 CNRS Université de Toulouse 3 rue Caroline Aigle Toulouse 31400 France
Synchrotron‐SOLEIL Saint‐Aubin, BP48 Gif sur Yvette Cedex F91192 France
Funding
European Research Council · Agence Nationale de la Recherche
References (27)
Show source-provided references
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