A Sensitive Broadband (UV–vis–NIR) Perovskite Photodetector Using Topological Insulator as Electrodes
Source abstract
Abstract
Abstract Here, a sensitive and broadband perovskite photodetector is developed by using crystalline topological insulator (TI) Bi2Se3 film as the electrode, which is synthesized by molecular beam epitaxy (MBE). The as‐fabricated Bi2Se3‐FA0.85Cs0.15PbI3‐Bi2Se3 photodetector exhibits apparent sensitivity to 650 nm illumination with an on/off ratio of 0.8 × 105 and good reproducibility. The responsivity, external quantum efficiency, and specific detectivity are estimated to be 8.4 A W−1, 1604%, and 1.7 × 1013 Jones, respectively, which are better not only than the perovskite device using Au as electrode, but also than the majority of other perovskite materials based devices. It is also interesting to find that the TI based perovskite photodetector displays obvious photoresponse to near infrared light (NIR) with 980 nm due to contribution of TI Bi2Se3 layer. It is believed that the present TI based perovskite photodetector holds promise for broadband and high‐performance optoelectronic applications in the future.
Source: crossref · Quality: baseline
Research context
OpenAlex topics: Perovskite Materials and Applications · Photorefractive and Nonlinear Optics · Transition Metal Oxide Nanomaterials
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
Affiliations
School of Materials Science and Engineering Anhui Provincial Key Laboratory of Advanced Functional Materials and Devices Hefei University of Technology Hefei Anhui 230009 China
School of Electronic Science and Applied Physics and Anhui Provincial Key Laboratory of Advanced Materials and Devices Hefei University of Technology Hefei Anhui 230009 China
Department of Physics National Cheng Kung University Tainan 701 Taiwan
Funding
National Natural Science Foundation of China
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