The Intrinsic Photoluminescence Spectrum of Perovskite Films

Abstract Photoluminescence spectroscopy is a simple and powerful characterization technique to determine material properties and dynamic effects in metal–halide perovskite optoelectronic systems. However, self‐absorption and thin film cavity effects, amplified due to their high refractive indices, can have a significant impact on spectral lineshapes, affecting the inferences drawn from such characterization. In this work, key variables extrinsic to the perovskite material influencing the photoluminescence spectrum of perovskite thin films are identified and an optical model to account for these factors is proposed. The model is used to extract the intrinsic spectrum of a film using complex refractive indices and film thickness as input variables. Lastly, the use of the model is extended to multilayer systems to demonstrate its applicability to complex device‐relevant stacks.