A Generic Protocol for Highly Reproducible Manufacturing of Efficient Perovskite Light‐Emitting Diodes Using In‐Situ Photoluminescence Monitoring

Abstract Halide perovskite light‐emitting diodes (PLEDs) have raised considerable attention due to their high color purity and rapid development performance. Although high‐efficiency PLEDs have been continuously and repeatedly reported, the lack of a highly reproducible manufacturing process for PLEDs hinders their future development and commercialization. Here, a generic protocol for rational control of the nucleation and crystallization process of the perovskite emission layer is reported. Through the monitoring of the photoluminescence during spin‐coating, the antisolvent dripping time can be precisely determined. Therefore, it is possible to repeatedly produce a perovskite emission layer with high PLQY, smooth surface/interface, and good homogeneity. As a result, high‐performance PLEDs are easily obtained. Moreover, the standard deviation of the fabricated PLEDs performance is smaller than 0.8%, showing high reproducibility independent of the process conditions such as the process temperature, solvent atmosphere, and spin‐coating parameters, which highlights the statement of the importance of rationally control of the antisolvent process. The methodology provides important progress towards highly reproducible manufacturing of PLEDs for practical applications.