Unraveling the Mechanism of Remote Scavenging Effect at the InP/Al2O3 Interface Induced by Titanium Layer
Abstract
Research context
OpenAlex topics: Semiconductor materials and devices · Ferroelectric and Negative Capacitance Devices · Advanced Memory and Neural Computing
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Affiliations
Engineering Research Center of Thin Film Optoelectronics Technology Ministry of Education Nankai University Tianjin 300350 China
Laboratory of Physical & Chemical Testing and Failure Analysis Ningbo Branch of Ordnance Science Institute of China Ningbo 315103 China
Suzhou Institute of Nano‐Tech and Nano‐Bionics (SINANO) Chinese Academy of Sciences Suzhou 215123 China
State Key Discipline Laboratory of Wide Band Gap Semiconductor Technology School of Microelectronics Xidian University Xi'an 710071 China
Funding
National Key Research and Development Program of China · National Natural Science Foundation of China