journal article·2019-03Open access

Ionic Gating of Ultrathin and Leaky Ferroelectrics

Yogesh Sharma, Anthony T. Wong, Andreas Herklotz, Dongkyu Lee, Anton V. Ievlev, Liam Collins, Ho Nyung Lee, Sheng Dai, Nina Balke, Philip D. Rack, Thomas Z. Ward

Advanced Materials Interfaces· Volume 6· Issue 5

Abstract

Ionic liquids are used to induce reversible large area polarization switching in ultrathin and highly defective ferroelectric films. Long range electrostatic charge control is induced by modifying the electric double layer at an ionic liquid–PbZr0.2Ti0.8O3 interface with electrostatic and electrochemical control of polarization orientation in the ferroelectric layer. The localized nature of the ionic gating mechanism prohibits the presence of leakage current, which has historically limited the switching of ultrathin and/or electrically leaky ferroelectric films in solid metal‐gated capacitor devices. This is demonstrated on ultrathin films and in massively defective films with >30% coverage of direct conducting channels running from surface to ground. This approach opens new design possibilities for integrating ultrathin ferroelectric films in functional electronic devices.
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Research context

OpenAlex topics: Ferroelectric and Piezoelectric Materials · Electronic and Structural Properties of Oxides · Advanced Memory and Neural Computing

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

Affiliations

Materials Science and Technology Division Oak Ridge National Laboratory 1 Bethel Valley Rd. Oak Ridge TN 37831 USA

Department of Materials Science and Engineering University of Tennessee Knoxville TN 37996 USA

Institute for Physics Martin‐Luther‐University Halle‐Wittenberg Halle 06120 Germany

Center for Nanophase Materials Science Oak Ridge National Laboratory 1 Bethel Valley Rd. Oak Ridge TN 37831 USA

Chemical Sciences Division Oak Ridge National Laboratory 1 Bethel Valley Rd. Oak Ridge TN 37831 USA

Funding

U.S. Department of Energy

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