Electrostatic Boundary Conditions and (Electro)chemical Interface Stability
Source abstract
Abstract
Abstract Interface stability is a key factor for stable operation of electronic and electrochemical devices. This contribution introduces an approach for the operando analysis of interfaces using photoelectron spectroscopy employing a solid oxide electrochemical cell. The combined chemical and electronic information provided by the experiment reveals that not only chemical but also electrostatic boundary conditions are essential for interface stability. The approach is demonstrated using (anti‐)ferroelectric (Pb,La)(Zr,Sn,Ti)O3 dielectrics.
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Research context
OpenAlex topics: Ferroelectric and Piezoelectric Materials · Electronic and Structural Properties of Oxides · Semiconductor materials and devices
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
Affiliations
Institute of Materials Science Technical University of Darmstadt Otto‐Berndt‐Str. 3 64287 Darmstadt Germany
Department of Physics Chalmers University of Technology SE‐41296 Gothenburg Sweden
Functional Materials Research Laboratory Tongji University Cao'an Road 4800 Shanghai 201804 China
Funding
Hessisches Ministerium für Wissenschaft und Kunst
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