High‐resolution Electron Microscopy of semiconductors and metals
Source abstract
Abstract
Review: Two‐dimensional information on the microstructure of materials at a resolution comparable to interatomic distances is crucial for the study of interfaces, defects, growth mechanisms etc. One of the most important analytical methods for gaining such information is high‐resolution electron microscopy (HREM). The interpretation of the results on semiconductors, magnetic alloys and multilayers, can often be facilitated through image processing and simulation.
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Research context
OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Magnetic properties of thin films · X-ray Diffraction in Crystallography
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References (58)
Show source-provided references
1. 10.1002/adma.1991003030410.1002/adma.19910030304 ↗
2. 10.1007/978-3-662-13553-210.1007/978-3-662-13553-2 ↗
3. Hirsch P. · 1965
4. Spence J. C. H. · 1988
5. 10.1007/978-94-009-5540-010.1007/978-94-009-5540-0 ↗
6. Bravman J. C. · 1988
7. A. F.de Jong:Image Interpretation for TEM of Thin Semiconductor Layers and Interfaces Ph.D. Thesis Delft Technical University Delft1990(Chapter I).
8. 10.1016/S0065-2539(08)60880-X10.1016/S0065-2539(08)60880-X ↗
9. Murarka S. P. · 1983
10. Nicolet M. A. · 1983 · 330
11. 10.1063/1.9369910.1063/1.93699 ↗
12. 10.1063/1.34156310.1063/1.341563 ↗
13. 10.1557/PROC-102-37710.1557/PROC-102-377 ↗
14. 10.1063/1.9783010.1063/1.97830 ↗
15. 10.1063/1.10144610.1063/1.101446 ↗
16. 10.1063/1.34560210.1063/1.345602 ↗
17. 10.1063/1.9624510.1063/1.96245 ↗
18. 10.1063/1.9713810.1063/1.97138 ↗
19. 10.1063/1.9970210.1063/1.99702 ↗
20. 10.1080/0141861820823693610.1080/01418618208236936 ↗
21. 10.1103/PhysRevLett.60.31310.1103/PhysRevLett.60.313 ↗
22. 10.1103/PhysRevLett.60.174310.1103/PhysRevLett.60.1743 ↗
23. 10.1103/PhysRevB.36.476910.1103/PhysRevB.36.4769 ↗
24. 10.1103/PhysRevB.37.630510.1103/PhysRevB.37.6305 ↗
25. 10.1063/1.10243910.1063/1.102439 ↗
26. 10.1080/0141861900824391710.1080/01418619008243917 ↗
27. 10.1016/0304-3991(84)90073-110.1016/0304-3991(84)90073-1 ↗
28. 10.1002/sia.74010040610.1002/sia.740100406 ↗
29. 10.1016/0304-3991(89)90200-310.1016/0304-3991(89)90200-3 ↗
30. 10.1103/PhysRevLett.63.29810.1103/PhysRevLett.63.298 ↗
31. Bulle‐Lieuwma C. W. T. · Proc. 12. ICEM, Seattle · 1990 · 4 · 344
32. C. W. T.Bulle‐Lieuwma A. F.de Jong andD. E. W.Vandenhoudt.Phil. Mag. A 1991 in press.
33. 10.1080/0141861840823343610.1080/01418618408233436 ↗
34. Buschow K. H. J. · 1980 · 297
35. 10.1016/0022-5088(88)90194-410.1016/0022-5088(88)90194-4 ↗
36. 10.1016/0304-8853(89)90127-310.1016/0304-8853(89)90127-3 ↗
37. 10.1016/0304-8853(90)90141-C10.1016/0304-8853(90)90141-C ↗
38. 10.1109/20.10437810.1109/20.104378 ↗
39. 10.1016/0022-5088(90)90180-R10.1016/0022-5088(90)90180-R ↗
40. 10.1080/0141861910820484410.1080/01418619108204844 ↗
41. W.Coene F.Hakkens T. H.Jacobs K. H. J.Buschow J. Solid State Chem. 1991 in press.
42. 10.1109/TMAG.1974.105837510.1109/TMAG.1974.1058375 ↗
43. 10.1088/0034-4885/40/10/00210.1088/0034-4885/40/10/002 ↗
44. 10.1080/1364281870822132810.1080/13642818708221328 ↗
45. 10.1007/BF0061701610.1007/BF00617016 ↗
46. 10.1063/1.33845910.1063/1.338459 ↗
47. 10.1007/BF0061701710.1007/BF00617017 ↗
48. 10.1016/0921-5107(90)90090-X10.1016/0921-5107(90)90090-X ↗
49. 10.1109/20.4242610.1109/20.42426 ↗
50. 10.1002/adma.1991003071510.1002/adma.19910030715 ↗
51. 10.1002/adma.1989001020310.1002/adma.19890010203 ↗
52. 10.1051/jphysrad:0195400150402250010.1051/jphysrad:01954001504022500 ↗
53. 10.1063/1.34224310.1063/1.342243 ↗
54. 10.1098/rspa.1949.009610.1098/rspa.1949.0096 ↗
55. 10.1016/0304-3991(84)90037-810.1016/0304-3991(84)90037-8 ↗
56. 10.1016/0304-3991(86)90193-210.1016/0304-3991(86)90193-2 ↗
57. 10.1002/adma.1991003031010.1002/adma.19910030310 ↗
58. Van Dyck D. · Proc. 12. ICEM, Seattle · 1990 · 1 · 26