Spatially Mapping Charge Carrier Density and Defects in Organic Electronics Using Modulation‐Amplified Reflectance Spectroscopy
Source abstract
Abstract
Charge-modulated optical spectroscopy is used to achieve dynamic two-dimensional mapping of the charge-carrier distribution in poly(3-hexylthiophene) thin-film transistors. The resulting in-channel distributions evolve from uniformly symmetric to asymmetrically saturated as the devices are increasingly biased. Furthermore, physical, chemical, and electrical defects are spatially resolved in cases where their presence is not obvious from the device performance.
Source: openalex_inverted_index · Quality: baseline
Research context
OpenAlex topics: Organic Electronics and Photovoltaics · Thin-Film Transistor Technologies · Advanced Memory and Neural Computing
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
Affiliations
Department of Polymer Science and Engineering University of Massachusetts Amherst 120 Governors Dr. Amherst MA 01003 USA
206 Kendade, Department of Physics Mount Holyoke College South Hadley MA 01075 USA
References (30)
Show source-provided references
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