Relating the Functional Properties of an Organic Semiconductor to Molecular Structure by nc‐AFM
Source abstract
Abstract
The structure and properties of different molecular scale PTCDA arrangements are investigated by noncontact-AFM. A hybrid optical–electrostatic characterization is used to locally probe freely grown and nanoconfined structures in order to connect opto-electronic properties with the molecular scale structure determined by high resolution AFM.
Source: openalex_inverted_index · Quality: baseline
Research context
OpenAlex topics: Force Microscopy Techniques and Applications · Thin-Film Transistor Technologies · Molecular Junctions and Nanostructures
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
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