Strongly Enhanced Thermal Stability of Crystalline Organic Thin Films Induced by Aluminum Oxide Capping Layers
Source abstract
Abstract
The thermal stability of thin films of di-indenoperylene (DIP), an organic semiconductor is shown via thermal desorption spectroscopy (TDS) and in-situ X-ray diffraction to be strongly enhanced by aluminum oxide capping layers. Possible mechanisms for the eventual breakdown of the film (which remains crystalline up to 460 °C) at high temperatures are discussed (see Figure).
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Research context
OpenAlex topics: Organic Electronics and Photovoltaics · Thin-Film Transistor Technologies · Organic Light-Emitting Diodes Research
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
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