Charge‐Injection Barriers at Realistic Metal/Organic Interfaces: Metals Become Faceless
Source abstract
Abstract
Interfaces between the organic semiconductor α-sexithiophene and sputter-cleaned (ideal) metals or contaminated (realistic) metals are investigated by a combined X-ray and UV photoemission spectroscopic study. The experimental results indicate a substantial impact of metal-surface contamination on the electronic properties of the interface. In particular, the hole-injection barrier is almost independent of the type of the underlying metal (see figure).
Source: openalex_inverted_index · Quality: baseline
Research context
OpenAlex topics: Semiconductor materials and devices · Semiconductor materials and interfaces · Organic Electronics and Photovoltaics
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