Show source-provided references
2. A. M.Ionescu Technical Digest – International Electron Devices Meeting IEDM2018 1.2.1.
3. Nguyen H. A. D. · 2017 IFIP/IEEE International Conference on Very Large Scale Integration (VLSI‐SoC) · 2017 · 1
15. X.Liu M.Mao B.Liu H.Li Y.Chen B.Li Y.Wang H.Jiang M.Barnell Q.Wu inProceedings of the 52nd Annual Design Automation Conference2015 pp.1.
10.1145/2744769.2744900 ↗17. N. P.Jouppi C.Young N.Patil D.Patterson G.Agrawal R.Bajwa S.Bates S.Bhatia N.Boden A.Borchers inProceedings of the 44th Annual International Symposium on Computer Architecture2017 pp.1–12.
10.1145/3079856.3080246 ↗19. Nature · 2016 · 29 · 1
23. Kim Y. · Science 1979 · 2018 · 360 · 998
25. N.Shukla R. K.Ghosh B.Gnsafe S.Datta inTechnical Digest – International Electron Devices Meeting IEDM IEEE 2018 pp.4.3.1‐4.3.4.
10.1109/IEDM.2017.8268325 ↗28. John R. A. · Nat. Commun. · 2022 · 13 · 1
32. Zhou G. · Adv. Electron. Mater. · 2022 · 8 · 1
33. Duan X. · Adv. Mater. · 2024 · 36 · 1
36. Yang R. · Adv. Electron. Mater. · 2019 · 5 · 1
38. Choi S. · Adv. Mater. · 2020 · 32 · 1
42. L.Ming H. Y.Kyoung D. S.Sung Y. Y.Yun D. W.Kim Y. C.Tae S. O.Kyung W. S.Lee inDigest of Technical Papers – Symposium on VLSI Technology IEEE 2009 pp.94–95.
46. Gopalakrishnan K. · IEEE Trans. Electron Devices · 2004 · 52 · 77
58. H. G.Rodriguez Q.Guo T.Moraitis inProceedings of the 39th International Conference on Machine Learning PMLR 2022 pp.18704–18722.
68. Dayan P. · 2005
74. Rumelhart D. E. · Biometrika · 1986 · 71 · 6
75. Minsky M. · 2017
77. V.Nair G. E.Hinton inProceedings of the 27th International Conference on Machine Learning (ICML‐10)2010 pp.807–814.
78. X.Glorot A.Bordes Y.Bengio inProceedings of the 14th International Conference on Artificial Intelligence and Statistics JMLR Workshop And Conference Proceedings 2011 pp.315–323.
81. Hinton G. E. · 2012 · 599
82. Maas A. L. · 2013 · 3
83. K.He X.Zhang S.Ren J.Sun inProceedings of the IEEE International Conference on Computer Vision2015 pp.1026–1034.
10.1109/ICCV.2015.123 ↗84. D.‐A.Clevert T.Unterthiner S.Hochreiter arXiv preprint arXiv:1511.072892015.
85. P.Ramachandran B.Zoph Q. VLe arXiv preprint arXiv:1710.059412017.
86. P.O'Connor M.Welling arXiv preprint arXiv:1602.083232016.
88. Cosemans S. · Technical Digest – International Electron Devices Meeting IEDM · 2019 · 518
89. X.Sun S.Yin X.Peng R.Liu J. S.Seo S.Yu inProceedings of the 2018 Design Automation and Test in Europe Conference and Exhibition DATE 2018 IEEE 2018 pp.1423–1428.
10.23919/DATE.2018.8342235 ↗90. C.Nail G.Molas P.Blaise G.Piccolboni B.Sklenard C.Cagli M.Bernard A.Roule M.Azzaz E.Vianello C.Carabasse R.Berthier D.Cooper C.Pelissier T.Magis G.Ghibaudo C.Vallee D.Bedeau O.Mosendz B.De Salvo L.Perniola inTechnical Digest – International ElectronDevices Meeting IEDM IEEE 2017 pp.4.5.1‐4.5.4.
10.1109/IEDM.2016.7838346 ↗92. Lee S.‐U. · Nano. Lett. · 2024 · 24 · 4869
95. Park S. O. · Nat. Commun. · 2022 · 13 · 1