journal article·2010-06-04

High‐Performance Flexible Transparent Thin‐Film Transistors Using a Hybrid Gate Dielectric and an Amorphous Zinc Indium Tin Oxide Channel

Jun Liu, D. Bruce Buchholz, Robert P. H. Chang, Antonio Facchetti, Tobin J. Marks

Advanced Materials· Volume 22· Issue 21
Publisher page

Abstract

High-performance flexible transparent thin-film transistors (TFTs) are demonstrated using amorphous zink indium tin oxide (ZITO) transparent oxide conductor electrodes, an amorphous ZITO transparent oxide semiconductor channel, and a vapor-deposited self-assembled nanodielectric (v-SAND) gate insulator. These TFTs exhibit a large field-effect mobility of 110 cm2V−1s−1, a current on/off ratio of 104, and a low operating voltage of 1.0 V, along with very good optical transparency and mechanical flexibility. Detailed facts of importance to specialist readers are published as ”Supporting Information”. Such documents are peer-reviewed, but not copy-edited or typeset. They are made available as submitted by the authors. Please note: The publisher is not responsible for the content or functionality of any supporting information supplied by the authors. Any queries (other than missing content) should be directed to the corresponding author for the article.
Source: openalex_inverted_index · Quality: baseline

Research context

OpenAlex topics: Thin-Film Transistor Technologies · ZnO doping and properties · Semiconductor materials and devices

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

References (38)

Show source-provided references
1. 10.1201/978020391177810.1201/9780203911778 ↗
2. 10.1080/1040843049088897710.1080/10408430490888977 ↗
3. 10.3390/s9060495510.3390/s90604955 ↗
4. 10.1038/414599a10.1038/414599a ↗
5. 10.1126/science.108527610.1126/science.1085276 ↗
6. 10.1038/nature0309010.1038/nature03090 ↗
7. 10.1038/nature0249810.1038/nature02498 ↗
8. 10.1002/adma.20040036810.1002/adma.200400368 ↗
9. 10.1002/adma.20070039310.1002/adma.200700393 ↗
10. Sze S. M. · 2007
11. 10.1002/adma.20080358410.1002/adma.200803584 ↗
12. 10.1063/1.154267710.1063/1.1542677 ↗
13. 10.1063/1.155399710.1063/1.1553997 ↗
14. 10.1063/1.184328610.1063/1.1843286 ↗
15. 10.1063/1.212089510.1063/1.2120895 ↗
16. 10.1021/ja903886r10.1021/ja903886r ↗
17. 10.1149/1.304981910.1149/1.3049819 ↗
18. 10.1063/1.322555510.1063/1.3225555 ↗
19. 10.1088/0022-3727/40/5/00410.1088/0022-3727/40/5/004 ↗
20. 10.1149/1.290386610.1149/1.2903866 ↗
21. 10.1002/adma.20060096110.1002/adma.200600961 ↗
22. 10.1039/b822893k10.1039/b822893k ↗
23. 10.1073/pnas.050102710210.1073/pnas.0501027102 ↗
24. 10.1002/adma.20050051710.1002/adma.200500517 ↗
25. 10.1002/adma.20080326710.1002/adma.200803267 ↗
26. 10.1021/ja801309g10.1021/ja801309g ↗
27. 10.1021/ja902751e10.1021/ja902751e ↗
28. 10.1007/s10832-004-5094-y10.1007/s10832-004-5094-y ↗
29. 10.1021/am900321f10.1021/am900321f ↗
30. Standard Test Methods for Measuring Adhesion by Tape Test (D3359‐02 ASTM International 2002).
31. 10.1021/ja900131y10.1021/ja900131y ↗
32. 10.1126/science.108321210.1126/science.1083212 ↗
33. 10.1038/nmat175510.1038/nmat1755 ↗
34. 10.1002/adma.20060063410.1002/adma.200600634 ↗
35. 10.1021/nl050254o10.1021/nl050254o ↗
36. 10.1002/adma.20050174010.1002/adma.200501740 ↗
37. 10.1073/pnas.040191810110.1073/pnas.0401918101 ↗
38. 10.1063/1.312695610.1063/1.3126956 ↗