Unveiling the Nanoscale Dielectric Gap and Its Influence on Ferroelectric Polarization Switching in Scanning Probe Microscopy (Adv. Funct. Mater. 11/2025)
Source abstract
Abstract
Ferroelectric Polarization Switching Scanning probe microscopy of ferroelectric materials faces challenges in accurately measuring coercive voltages due to the dielectric gap between the probe tip and sample surface. In article number 2406944, Lane W. Martin, Seungbum Hong, and co-workers reveal how different dielectric media in this gap significantly influence measurement outcomes. Using water as a high-permittivity medium (ϵr = 79) enables more reliable measurements that closely match conventional capacitor-based studies, providing a pathway to accurate quantitative analysis of ferroelectric materials.
Source: openalex_inverted_index · Quality: baseline
Research context
OpenAlex topics: Force Microscopy Techniques and Applications · Surface Roughness and Optical Measurements · Adhesion, Friction, and Surface Interactions
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Affiliations
Department of Materials Science and Engineering KAIST Daejeon 34141 Republic of Korea
Department of Materials Science and Engineering University of California Berkeley CA 94720 USA
Departments of Materials Science and NanoEngineering Chemistry, and Physics and Astronomy and the Rice Advanced Materials Institute Rice University Houston TX 77005 USA
KAIST Institute for NanoCentury (KINC) KAIST Daejeon 34141 Republic of Korea
References
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