Influence of tin doping and annealing on structural and optical properties of nickel oxide thin films prepared via spray pyrolysis
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Abstract
Nickel oxide (NiO) is a p-type semiconductor with applications in optoelectronics, such as solar cells and photo detectors. This study explores the effects of Sn doping and annealing on NiO thin films, prepared using a cost-effective spray pyrolysis method. Doping concentrations of 3%, 6%, and 9% Sn were tested, and annealing at 500°C improved structural properties. XRD confirmed crystallinity, and the bandgap increased with doping, enhancing electronic properties. Urbach energy values indicated improved optoelectronic potential, contributing insights for optimizing NiO-based devices, particularly in solar cell applications. The findings emphasize NiO's viability for advanced optoelectronic technologies.
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References (49)
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1. [1] M. Matsumiya, F. Qiu, W. Shin, N. Izu, N. Murayama, S. Kanzaki, Thin Solid Films 419(1- 2), 213 (2002); https://doi.org/10.1016/S0040-6090(02)00762-9 116510.1016/S0040-6090(02)00762-9 ↗
2. [2] H. T. Wang, D. K. Mishra, P. Chen, J. M. Ting, Journal of Alloys and Compounds 584, 142 (2014); https://doi.org/10.1016/j.jallcom.2013.08.14210.1016/j.jallcom.2013.08.142 ↗
3. [3] F. H. Hsu, N. F. Wang, Y. Z. Tsai, Y. S. Cheng, M. P. Houng, Journal of Physics D: Applied Physics 46(27), 275104 (2013); https://doi.org/10.1088/0022-3727/46/27/27510410.1088/0022-3727/46/27/275104 ↗
4. [4] H. Wang, Z. Shi, B. Zhang, G. Wu, J. Wang, Y. Zhao, Journal of Luminescence 135, 160 (2013); https://doi.org/10.1016/j.jlumin.2012.10.02410.1016/j.jlumin.2012.10.024 ↗
5. [5] M. A. Abbasi, Z. H. Ibupoto, M. Hussain, O. Nur, M. Willander, Nanoscale Research Letters 8, 1 (2013); https://doi.org/10.1186/1556-276X-8-32010.1186/1556-276X-8-320 ↗
6. [6] S. Chandramohan, K. Bok Ko, J. Han Yang, B. Deul Ryu, Y. S. Katharria, T. Yong Kim, C. H. Hong, Journal of Applied Physics 115(5), (2014); https://doi.org/10.1063/1.486364010.1063/1.4863640 ↗
7. [7] H. Long, L. Ai, S. Li, H. Huang, X. Mo, H. Wang, G. Fang, Materials Science and Engineering B 184, 44 (2014); https://doi.org/10.1016/j.mseb.2014.01.00110.1016/j.mseb.2014.01.001 ↗
8. [8] N. Park, K. Sun, Z. Sun, Y. Jing, D. Wang, Journal of Materials Chemistry C 1(44), 7333 (2013); https://doi.org/10.1039/c3tc31444h10.1039/c3tc31444h ↗
9. [9] W. W. A. Bakar, M. Y. Othman, R. Ali, C. K. Yong, S. Toemen, Modern Applied Science 3(2), 36 (2009); https://doi.org/10.5539/mas.v3n2p3510.5539/mas.v3n2p35 ↗
10. [10] N. Shaigan, D. G. Ivey, W. Chen, Journal of the Electrochemical Society 156(6), B765 (2009); https://doi.org/10.1149/1.311625210.1149/1.3116252 ↗
11. [11] P. S. Patil, Materials Chemistry and physics, 59(3), 185-198(1999); https://doi.org/10.1016/S0254-0584(99)00049-810.1016/S0254-0584(99)00049-8 ↗
12. [12] S. Akinkuade, B. Mwankemwa, J. Nel, W. Meyer, Physica B: Condensed Matter, 535, 24- 28(2018); https://doi.org/10.1016/j.physb.2017.06.02110.1016/j.physb.2017.06.021 ↗
13. [13] X. Tang, Q. Yang, Journal of Electronic Materials 48, 7336-7344 (2019); https://doi.org/10.1007/s11664-019-07552-510.1007/s11664-019-07552-5 ↗
14. [14] H. Sato, T. Minami, S. Takata, T. Yamada, Thin solid films 236(1-2), 27-31(1993); https://doi.org/10.1016/0040-6090(93)90636-410.1016/0040-6090(93)90636-4 ↗
15. [15] P. Zhai, Q. Yi, J. Jian, H. Wang, P. Song, C. Dong, G. Zou, Chemical Communications 50(15), 1854-1856(2014); https://doi.org/10.1039/c3cc48877b10.1039/c3cc48877b ↗
16. [16] N. S. Sadeq, M. A. Hassan, Z. G. Mohammadsalih, Int. J. Thin Film Sci. Tec 11(1), 101-110 (2022); https://doi.org/10.18576/ijtfst/11011310.18576/ijtfst/110113 ↗
17. [17] L. Hu, R. H. Wei, X. W. Tang, W. J. Lu, X. B. Zhu, Y. P. Sun, Journal of Applied Physics 128(14) (2020); https://doi.org/10.1063/5.002365610.1063/5.0023656 ↗
18. [18] A. Ainabayev, B. Walls, D. Mullarkey, D. Caffrey, K. Fleischer, C. M. Smith, I. Shvets, Scientific Reports 14(1), 1928 (2024); https://doi.org/10.1038/s41598-024-52024-410.1038/s41598-024-52024-4 ↗
19. [19] A. N. Banerjee, K. K. Chattopadhyay, Progress in Crystal Growth and Characterization of Materials 50(1-3)52-105 (2005); https://doi.org/10.1016/j.pcrysgrow.2005.10.00110.1016/j.pcrysgrow.2005.10.001 ↗
20. [20] K. H. Kim, C. Takahashi, Y. Abe, M. Kawamura, Optik 125(12), 2899-2901 (2014); https://doi.org/10.1016/j.ijleo.2013.11.07410.1016/j.ijleo.2013.11.074 ↗
21. [21] J. D. Desai, Min S. K., K. D. Jung, O. S. Joo, Applied Surface Science, 253(4), 1781- 1786(2006); https://doi.org/10.1016/j.apsusc.2006.03.00910.1016/j.apsusc.2006.03.009 ↗
22. [22] M. M. Ibrahim, M. A. Hassan, K. I. Hassoon, Bull Mater Sci 46, 120 (2023); https://doi.org/10.1007/s12034-023-02954-y10.1007/s12034-023-02954-y ↗
23. [23] J. D. Desai. Journal of Materials Science: Materials in Electronics, 27(12), 12329-12334 (2016); https://doi.org/10.1007/s10854-016-5617-810.1007/s10854-016-5617-8 ↗
24. [24] A. N. Hussain, K. I. Hassoon, M. A. Hassan. In Journal of Physics: Conference Series 1530(1) 012140(2020); https://doi.org/10.1088/1742-6596/1530/1/01214010.1088/1742-6596/1530/1/012140 ↗
25. [25] R. S. Kate, S. C. Bulakhe, R. J. Deokate, Optical and Quantum Electronics, 51(10), 319 (2019); https://doi.org/10.1007/s11082-019-2026-2 116610.1007/s11082-019-2026-2 ↗
26. [26] L. Das, E. J. Canto-Aguilar, T. Tapani, H. Lin, H. Bhuvanendran, N. Boulanger, N. Maccaferri, Journal of Physics D: Applied Physics, 57(38), 385303 (2024); https://doi.org/10.1088/1361-6463/ad584a10.1088/1361-6463/ad584a ↗
27. [27] P. S. Patil, L. D. Kadam, Applied Surface Science, 199(1-4), 211-221 (2002); https://doi.org/10.1016/S0169-4332(02)00839-510.1016/S0169-4332(02)00839-5 ↗
28. [28] R. Sharma, A. D. Acharya, S. B. Shrivastava, T. Shripathi, V. Ganesan. Optik, 125(22), 6751-6756 (2014); https://doi.org/10.1016/j.ijleo.2014.07.10410.1016/j.ijleo.2014.07.104 ↗
29. [29] S. M. Karadeniz, A. E. Ekinci, F. N. Tuzluca, M. Ertuрrul, Asian J. Chem, 24(4), 1765- 1768(2012).
30. [30] M. Obaida, A. M. Fathi, I. Moussa, H. H. Afify, Journal of Materials Research 37(14), 2282-2292 (2022); https://doi.org/10.1557/s43578-022-00627-w10.1557/s43578-022-00627-w ↗
31. [31] K. O. Ukoba, A. C. Eloka-Eboka, F. L. Inambao, Renewable and Sustainable Energy Reviews 82, 2900-2915 (2018); https://doi.org/10.1016/j.rser.2017.10.04110.1016/j.rser.2017.10.041 ↗
32. [32] P. Salunkhe, M. A. AV, D. Kekuda, Applied Physics A 127(5), 390 (2021); https://doi.org/10.1007/s00339-021-04501-010.1007/s00339-021-04501-0 ↗
33. [33] Y. Reddy, A. M. Reddy, A. S. Reddy, P. S. Reddy, J. Nano. Elect. Phy. 4(4) 04002(2012).
34. [34] I. Hotový, D. Buc, Š. Haščík, O. Nennewitz, Vacuum 50(1-2), 41-44 (1998); https://doi.org/10.1016/S0042-207X(98)00011-610.1016/S0042-207X(98)00011-6 ↗
35. [35] A. M. Reddy, C. W. Byun, S. K. Joo, A. S. Reddy, P. S. Reddy, Electronic Materials Letters 10, 887-892 (2014); https://doi.org/10.1007/s13391-014-2181-310.1007/s13391-014-2181-3 ↗
36. [36] A. Hakim, J. Hossain, K. A. Khan, Renewable Energy 34(12), 2625-2629 (2009); https://doi.org/10.1016/j.renene.2009.05.01410.1016/j.renene.2009.05.014 ↗
37. [37] A. Bouhank, B. Youcef, S. Hacene, J. Chem. 12, 116-120 (2018).
38. [38] B. G. Trabelsi, F. H. Alkallas, A. Ziouche, A. Boukhachem, M. Ghamnia, H. Elhouichet, Crystals 12(5), 692(2022); https://doi.org/10.3390/cryst1205069210.3390/cryst12050692 ↗
39. [39] A. L. Patterson, Physical Review 56(10), 978 (1939); https://doi.org/10.1103/PhysRev.56.97810.1103/PhysRev.56.978 ↗
40. [40] P. Scherrer, Nach Ges Wiss Gottingen 2, 8-100 (1918).
41. [41] G. K. Williamson, R. E. Smallman, Philosophical Magazine 1(1), 34-46 (1956); https://doi.org/10.1080/1478643560823807410.1080/14786435608238074 ↗
42. [42] J. I. Langford, A. J. C. Wilson, Journal of Applied Crystallography 11(2), 102-113 (1978); https://doi.org/10.1107/S002188987801284410.1107/S0021889878012844 ↗
43. [43] S. M. Menaka, G. Umadevi, Silicon 10(5), 2023-2029 (2018); https://doi.org/10.1007/s12633-017-9716-910.1007/s12633-017-9716-9 ↗
44. [44] M. Fox, Optical Properties of Solids, Oxford University Press (2010).
45. [45] Y. Liu, M. Liu, Advanced Engineering Materials 8(1-2), 89-93 (2006). https://doi.org/10.1002/adem.20050021210.1002/adem.200500212 ↗
46. [46] R. A. Ismail, A. M. Mousa, M. A. Hassan, Optik 179, 29-36 (2019); https://doi.org/10.1016/j.ijleo.2018.10.17010.1016/j.ijleo.2018.10.170 ↗
47. [47] M. M. Gomaa, M. Boshta, B. S. Farag, M. B. S. Osman, Journal of Materials Science: Materials in Electronics 27, 711-717 (2016); https://doi.org/10.1007/s10854-015-3807-410.1007/s10854-015-3807-4 ↗
48. [48] M. S. Jamal, S. A. Shahahmadi, P. Chelvanathan, H. F. Alharbi, M. R. Karim, M. A. Dar, M. Akhtaruzzaman, Results in Physics 14, 102360 (2019); https://doi.org/10.1016/j.rinp.2019.10236010.1016/j.rinp.2019.102360 ↗
49. [49] M. Aftab, M. Z. Butt, D. Ali, F. Bashir, T. M. Khan, Optical Materials 119, 111369 (2021); https://doi.org/10.1016/j.optmat.2021.11136910.1016/j.optmat.2021.111369 ↗