Monolithic MoS ₂ Strain‐Tunable Spectrometer for on‐Chip Hyperspectral Imaging

Abstract The development of ultracompact spectrometers is critically important for applications with stringent size and weight constraints, including implantable medical devices, portable electronics, and field‐deployable characterization systems. A monolithic spectrometer based on strain‐engineered monolayer MoS ₂ that achieves broadband visible operation (470–750 nm) with 9 nm resolution through a novel strain‐mediated spectral decoding mechanism, is presented. Leveraging the exceptional electromechanical coupling and strain‐tunable optoelectronic properties of 2D MoS ₂ , the device utilizes resonant‐frequency electromechanical excitation (20.02–20.08 MHz) to systematically control the spectral response, enabling sub‐10‐nm resolution (Δλ = 9 nm) without conventional dispersive optics. A computationally efficient reconstruction algorithm incorporating Tikhonov regularization with generalized cross‐validation solves the ill‐posed inverse problem while maintaining spectral fidelity (>90% correlation with commercial systems). The 6.5 Å‐thick active layer enables unprecedented miniaturization (50 × size reduction vs conventional systems) while preserving exceptional performance (Q >800, response time <100 µs). This architecture not only establishes a new paradigm for on‐chip spectroscopic systems but also demonstrates immediate applications in hyperspectral imaging (100 µm spatial resolution), CIE‐standard color reconstruction (ΔE <3), and spectrally encrypted communications. By bridging atomic‐scale strain engineering and macroscopic spectroscopy, this work provides an avenue for lab‐on‐a‐chip diagnostic platforms, wearable biosensors, and integrated photonic systems.