journal article·2026-06

Atomic-scale scanning single-electron transistor microscopy for low-angle twisted two-dimensional heterostructures

Behnam Esmaeilzadeh, Hossein Chamkouri, Zubaida Rukhsana Usha, Syed Asad Maqbool, Muhammad Touqeer

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OpenAlex topics: 2D Materials and Applications · Surface and Thin Film Phenomena · Topological Materials and Phenomena

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References (100+)

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